In recent years more emphasis has been placed on the analytical potential of Secondary Ion Mass Spectrometry (SIMS) for the study of organic materials [1,2,3]. We wish to report on static SIMS experiments on a few simple mole-cules condensed on a copper substrate held at low temperatures. For the experiments we used an Extranuclear Inc., quadrupole massfilter equipped with a Bessel box type energy filter. The bandwidth of the ions accepted in the massfilter was set at 1 eV. Our ion gun is differential pumped and during the experiments a pressure in the 10-9 torr range could easily be maintained in the main chamber. Our primary ion beam current density was between 1 and 10 nA/cm2 and the beam energy was varied between 500 and 5000 eV. As pri...
The main aim of the research presented in this dissertation is to develop a novel imaging mass spect...
Secondary ion mass spectrometry (SIMS) and tandem mass spectrometry (MS/MS) are useful techniques fo...
Through analyzing mixtures of compounds of known gas-phase basicities, the importance of this proper...
The 22nd International Conference on Ion Beam Analysis (IBA 2015)Secondary ion mass spectrometry (SI...
The authors have developed a mass spectrometer capable of surface analysis using the techniques of s...
This paper reviews the current state of Secondary Ion Mass Spectrometry (SIMS) applied to the invest...
Secondary ion mass spectra of solid nitrogen and carbon monoxide were observed at 15 K. The effects ...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
MeV SIMS is a type of secondary ion mass spectrometry technique (SIMS) where molecules are desorbed ...
This work sets out a framework to provide a metrological basis for static SIMS measurements. This su...
The low energy range (a few 100 keV to a few MeV) primary ion mode in MeV Secondary Ion Mass Spectro...
Imaging mass spectrometry (IMS), based on linking mass-analysis data for ions and their original pos...
Secondary-ion mass spectrometry (SIMS) is based on the acceleration of high-energy primary ions onto...
Secondary ion mass spectra of neat solid argon, krypton, and xenon were measured as a function of th...
The main aim of the research presented in this dissertation is to develop a novel imaging mass spect...
Secondary ion mass spectrometry (SIMS) and tandem mass spectrometry (MS/MS) are useful techniques fo...
Through analyzing mixtures of compounds of known gas-phase basicities, the importance of this proper...
The 22nd International Conference on Ion Beam Analysis (IBA 2015)Secondary ion mass spectrometry (SI...
The authors have developed a mass spectrometer capable of surface analysis using the techniques of s...
This paper reviews the current state of Secondary Ion Mass Spectrometry (SIMS) applied to the invest...
Secondary ion mass spectra of solid nitrogen and carbon monoxide were observed at 15 K. The effects ...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
Secondary Ion Mass Spectrometry (SIMS) extracts chemical, elemental, or isotopic information about a...
MeV SIMS is a type of secondary ion mass spectrometry technique (SIMS) where molecules are desorbed ...
This work sets out a framework to provide a metrological basis for static SIMS measurements. This su...
The low energy range (a few 100 keV to a few MeV) primary ion mode in MeV Secondary Ion Mass Spectro...
Imaging mass spectrometry (IMS), based on linking mass-analysis data for ions and their original pos...
Secondary-ion mass spectrometry (SIMS) is based on the acceleration of high-energy primary ions onto...
Secondary ion mass spectra of neat solid argon, krypton, and xenon were measured as a function of th...
The main aim of the research presented in this dissertation is to develop a novel imaging mass spect...
Secondary ion mass spectrometry (SIMS) and tandem mass spectrometry (MS/MS) are useful techniques fo...
Through analyzing mixtures of compounds of known gas-phase basicities, the importance of this proper...