Improving the Testability of Mixed-Signal Integrated Circuits

This paper presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated circuits. We begin by outlining the role of test, and its impact on product cost and quality. A brief look at the pending test crises for mixed-signal circuits is also considered. Subsequently, we shall outline several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. The remainder of the paper will describe several analog test buses and circuits for built-in self-test applications. 1