Abstract- Concurrently, a symbolic approach for analog system-level fault diagnosis and a systematic approach to maximize the fault location capability are proposed. This unified approach is realized as a result of combining the simulation before test (SBT) fault dictionary diagnosis method with a symbolic approach. The traditional SBT fault dictionary method is often costly and inefficient because of a high number of simulations, but it can become very efficient when a symbolic approach is employed. This symbolic approach only requires one analysis for circuit topology to generate the network transfer function and a parameter substitution to obtain the frequency response (or time response) of the system. An efficient program is developed t...
[[abstract]]Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we...
[[abstract]]Fault diagnosis algorithms for logic designs with only partial scan support remains inad...
This paper rewievs a fault diagnosis technique, which efficiently localizes a fault in resistive net...
Concurrently, a symbolic approach for analog system-level fault. Diagnosis and a systematic approach...
This paper presents a network theoretical approach to analog DC-fault diagnosis. The developed appro...
International audienceThe basic principle of concurrent testing techniques consists in exploiting th...
Abstract — This paper presents a network theoret-ical approach to analog DC-fault diagnosis. The de-...
Many problems in the domain of digital circuit testing and diagnosis demand the processing of a larg...
This paper presents a sensitivity-based test generation tool for analog multifrequency testing and d...
This paper presents a sensitivity-based test generation tool for analog multifrequency testing and d...
This paper presents a new symbolic ATPG approach for stuck-at faults in speed-independent asynchrono...
This paper addresses the fault diagnosis issue based on a simulation before test philosophy in analo...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularl...
Fault diagnosis has played an important role in the identification of fault mechanisms and the subse...
[[abstract]]Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we...
[[abstract]]Fault diagnosis algorithms for logic designs with only partial scan support remains inad...
This paper rewievs a fault diagnosis technique, which efficiently localizes a fault in resistive net...
Concurrently, a symbolic approach for analog system-level fault. Diagnosis and a systematic approach...
This paper presents a network theoretical approach to analog DC-fault diagnosis. The developed appro...
International audienceThe basic principle of concurrent testing techniques consists in exploiting th...
Abstract — This paper presents a network theoret-ical approach to analog DC-fault diagnosis. The de-...
Many problems in the domain of digital circuit testing and diagnosis demand the processing of a larg...
This paper presents a sensitivity-based test generation tool for analog multifrequency testing and d...
This paper presents a sensitivity-based test generation tool for analog multifrequency testing and d...
This paper presents a new symbolic ATPG approach for stuck-at faults in speed-independent asynchrono...
This paper addresses the fault diagnosis issue based on a simulation before test philosophy in analo...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we particularl...
Fault diagnosis has played an important role in the identification of fault mechanisms and the subse...
[[abstract]]Fault diagnosis is to predict the potential fault sites in a logic IC. In this paper, we...
[[abstract]]Fault diagnosis algorithms for logic designs with only partial scan support remains inad...
This paper rewievs a fault diagnosis technique, which efficiently localizes a fault in resistive net...