Approved for public release; distribution unlimited b-. 6:..i i- " " o;. _ '-. Preface The purpose of this study was to investigate methods of designing a circuit that would be highly testable when completed. This subject is of great interest to the government as well as private industry. The more testable a circuit is, the more time and money can be saved once a device is fabricated. It is for these reasons that I chose this topic. During this study, methods were examined to design testable circuits, and were implemented in a design of my own. Although not completely self-testing, the design * should give you a feeling for the difficulty of designing. such a circuit, and the ease of testing it. In would like to thank my fa...
Very Large Scale Integrated Circuits (VLSI) design has moved from costly curiosity to an everyday ne...
There are basically three methods of designing Very Large Scale Integrated (VLSI) circuits; Gate Arr...
In this dissertation we investigate the problem of test generation for VLSI circuits, and the concep...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Thesis (Ph. D.)--University of Washington, 1999Industry trends aimed at procuring greater levels of ...
Even though a circuit is designed error-free, manufactured circuits may not function correctly. Sinc...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
The main objective of this project is to design testability features that can potentially be include...
This thesis presents a new approach to building a design for testability (DFT) system. The system ...
The phenomenal development in electronic systems has, in large part, the advances in Very Large Scal...
The phenomenal development in electronic systems has, in large part, the advances in Very Large Scal...
An increasing part of the overall costs of custom and semicustom integrated circuits has to be spent...
Very Large Scale Integrated Circuits (VLSI) design has moved from costly curiosity to an everyday ne...
There are basically three methods of designing Very Large Scale Integrated (VLSI) circuits; Gate Arr...
In this dissertation we investigate the problem of test generation for VLSI circuits, and the concep...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Thesis (Ph. D.)--University of Washington, 1999Industry trends aimed at procuring greater levels of ...
Even though a circuit is designed error-free, manufactured circuits may not function correctly. Sinc...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
Test generation for sequential VLSI circuits has remained a formidable problem to solve. The problem...
The main objective of this project is to design testability features that can potentially be include...
This thesis presents a new approach to building a design for testability (DFT) system. The system ...
The phenomenal development in electronic systems has, in large part, the advances in Very Large Scal...
The phenomenal development in electronic systems has, in large part, the advances in Very Large Scal...
An increasing part of the overall costs of custom and semicustom integrated circuits has to be spent...
Very Large Scale Integrated Circuits (VLSI) design has moved from costly curiosity to an everyday ne...
There are basically three methods of designing Very Large Scale Integrated (VLSI) circuits; Gate Arr...
In this dissertation we investigate the problem of test generation for VLSI circuits, and the concep...