Charged coupled devices (CCDs) are much common in use in different imaging modalities. In most cases, they mainly limit the resolution of imaging devices. The resolution may be limited by them in two different ways: one by the finite non-zero size of pixels and second by the spacing between the pixels or the pixel pitch. If the pixel spacings do not follow the Nyquist sampling theorem, the information obtained does not represent the true picture of the object. The under-sampling by CCD has been dealt before in literature by placing optical mask at the Fourier plane in a 4f system assuming pixels as point pixels and reusing the same optical mask at the Fourier spectrum of the image captured by the CCD. If the pixels have non-zero width, as t...
CCD technology has kept developing since CCD was invented and has very wide application in all kinds...
© 2011 by Taylor and Francis Group, LLC. The relation between sensor resolution and the optics of a ...
The traditional method for measuring CCD non-linearity using constant flux and variable exposure tim...
Abstract: In this paper we describe in detail a method for calibrating a CCD-based camera. The calib...
A novel high resolution imaging technique-subpixel imaging with area-array CCD sensors-is presented....
This article deals with a pristine method to estimate the noise introduced by optical imaging system...
We review recent progress in the field, using as a framework a partial list of present limitations ...
Resolution of the imaging devices is mainly restricted by the pixels pitch, the pixels size and shap...
Two fundamental motivations exist for designing remote sensing systems that are undersampled: (1) SN...
One of the main limitations for the resolution of optical instruments is the size of the sensor-s pi...
This paper reports on two new advancements in CCD technology. The first area of development has prod...
If images are undersampled during electronic recording and reproduction, regular patterns in the ima...
This paper reports on two new advancements in CCD technology. The first area of development has prod...
Commercial and R&D photoluminescence imaging systems commonly employ indirect bandgap silicon charge...
Based on in-depth analysis of the relative radiation scaling theorem and acquired scaling data of pi...
CCD technology has kept developing since CCD was invented and has very wide application in all kinds...
© 2011 by Taylor and Francis Group, LLC. The relation between sensor resolution and the optics of a ...
The traditional method for measuring CCD non-linearity using constant flux and variable exposure tim...
Abstract: In this paper we describe in detail a method for calibrating a CCD-based camera. The calib...
A novel high resolution imaging technique-subpixel imaging with area-array CCD sensors-is presented....
This article deals with a pristine method to estimate the noise introduced by optical imaging system...
We review recent progress in the field, using as a framework a partial list of present limitations ...
Resolution of the imaging devices is mainly restricted by the pixels pitch, the pixels size and shap...
Two fundamental motivations exist for designing remote sensing systems that are undersampled: (1) SN...
One of the main limitations for the resolution of optical instruments is the size of the sensor-s pi...
This paper reports on two new advancements in CCD technology. The first area of development has prod...
If images are undersampled during electronic recording and reproduction, regular patterns in the ima...
This paper reports on two new advancements in CCD technology. The first area of development has prod...
Commercial and R&D photoluminescence imaging systems commonly employ indirect bandgap silicon charge...
Based on in-depth analysis of the relative radiation scaling theorem and acquired scaling data of pi...
CCD technology has kept developing since CCD was invented and has very wide application in all kinds...
© 2011 by Taylor and Francis Group, LLC. The relation between sensor resolution and the optics of a ...
The traditional method for measuring CCD non-linearity using constant flux and variable exposure tim...