The study of spontaneous emission for n-type GaAs has shown that the spectral shape and peak position may be utilized to determine the free elec-tron concentration within ___15 % near concentrations of 5 x 1017 cm-8 and • at 5 x 10 ls cm-3. Excitation of the sample with a 1 ~ diameter electron beam gives such sensitivity with a 3-6 ~ spatial resolution. This sensitivity and spatial resolution are sufficient for investigating sample inhomogeneities that are related to the spatial variations in the quantum efficiency. Several investigations (1,2) of radiative recom-bination in heavily doped GaAs have shown that the photoluminescent peak shifts to higher energy as the donor concentration is increased above 5 x 1017 cm-~. Cusano (3) has reporte...
The recombination properties of minority carriers have been determined from EBIC and CL measurements...
Experiments show that in both GaAs diffused with copper and GaAs heating treatment a photoluminescen...
We present an effective method of determining the doping level in n-type III–V semiconductors at the...
We have investigated the excitation intensity dependence of the spatial distribution of the emission...
Cathodoluminescence has attracted interest in scanning transmission electron microscopy since the ad...
Supplemental MaterialDoping is a fundamental property of semiconductors and constitutes the basis of...
International audienceDoping is a fundamental property of semiconductors and constitutes the basis o...
A theoretical model has been developed for determining free electron concentration in n-GaAs from ch...
Doping is a fundamental property of semiconductors and constitutes the basis of modern microelectron...
The transverse thermal properties of the electrons photo-emitted from GaAs determine the intrinsic b...
ABSTRACT-One of the advantages of the scanning transmission electron microscope cathodoluminescence ...
The authors designed an energy analyser for electron beams which exploits the retarding potential me...
For most materials science oriented applications incoherent cathodoluminescence (CL) is of main inte...
We have measured the electron optical capture cross section, σ0n(hν), of EL2 (the most important nat...
The temperature Tsube of photoexcited carriers in semi-insulating GaAs wafers is determined with hig...
The recombination properties of minority carriers have been determined from EBIC and CL measurements...
Experiments show that in both GaAs diffused with copper and GaAs heating treatment a photoluminescen...
We present an effective method of determining the doping level in n-type III–V semiconductors at the...
We have investigated the excitation intensity dependence of the spatial distribution of the emission...
Cathodoluminescence has attracted interest in scanning transmission electron microscopy since the ad...
Supplemental MaterialDoping is a fundamental property of semiconductors and constitutes the basis of...
International audienceDoping is a fundamental property of semiconductors and constitutes the basis o...
A theoretical model has been developed for determining free electron concentration in n-GaAs from ch...
Doping is a fundamental property of semiconductors and constitutes the basis of modern microelectron...
The transverse thermal properties of the electrons photo-emitted from GaAs determine the intrinsic b...
ABSTRACT-One of the advantages of the scanning transmission electron microscope cathodoluminescence ...
The authors designed an energy analyser for electron beams which exploits the retarding potential me...
For most materials science oriented applications incoherent cathodoluminescence (CL) is of main inte...
We have measured the electron optical capture cross section, σ0n(hν), of EL2 (the most important nat...
The temperature Tsube of photoexcited carriers in semi-insulating GaAs wafers is determined with hig...
The recombination properties of minority carriers have been determined from EBIC and CL measurements...
Experiments show that in both GaAs diffused with copper and GaAs heating treatment a photoluminescen...
We present an effective method of determining the doping level in n-type III–V semiconductors at the...