Abstract. 2014 For the purpose to observe and analyze the transient phenomena after the start of irradiation and the relaxation phenomena after the cessation of irradiation, techniques for intermit-tent electron irradiation are developed with a high voltage electron microscope, utilizing the STEM function installed in H-1250ST. One of the two methods developed is to make move the electron beam along a circle passing the area of interest in each cycle, which has an advantageous feature of invariant accumulated irradiation time regardless of the frequency. In another method, the electron beam goes back and forth between two positions, in which there is a free choice of the combination of the on- and off-time of electron beam. Dynamical contro...
AbstractAn in situ ion irradiation transmission electron microscope has been developed and is operat...
This thesis is dedicated to the development of a beam blanker for Ultrafast Electron Microscopy. Ult...
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even complet...
Abstract. 2014 At first, a brief historical sketch of the development of in-situ experiments in elec...
publisher[Abstract] High-energy electron microscopy has been improved from a powerful tool for both ...
Some applications of high voltage electron microscope (HVEM) at Hitachi are reviewed. Accompanied by...
Abstract. High voltage electron microscopy (HVEM), using electron energies adequate for causing disp...
The intermediate voltage electron microscope-tandem user facility in the Electron Microscopy Center ...
Many special techniques have been developed in electron microscopy. Electron tomograpy is used to ge...
Since Fall 1995, a state-of-the-art intermediate voltage electron microscope (IVEM) has been operati...
Real-time phase-plateless electron phase microscopy based on active image processing has been develo...
One of the most fundamental problems of modern natural science is the direct observation of atomic m...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
The development of a dynamic environmental transmission electron microscope (DETEM) at the Universit...
Three instruments for femtosecond electron diffraction (FED) experiments were erected, partially com...
AbstractAn in situ ion irradiation transmission electron microscope has been developed and is operat...
This thesis is dedicated to the development of a beam blanker for Ultrafast Electron Microscopy. Ult...
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even complet...
Abstract. 2014 At first, a brief historical sketch of the development of in-situ experiments in elec...
publisher[Abstract] High-energy electron microscopy has been improved from a powerful tool for both ...
Some applications of high voltage electron microscope (HVEM) at Hitachi are reviewed. Accompanied by...
Abstract. High voltage electron microscopy (HVEM), using electron energies adequate for causing disp...
The intermediate voltage electron microscope-tandem user facility in the Electron Microscopy Center ...
Many special techniques have been developed in electron microscopy. Electron tomograpy is used to ge...
Since Fall 1995, a state-of-the-art intermediate voltage electron microscope (IVEM) has been operati...
Real-time phase-plateless electron phase microscopy based on active image processing has been develo...
One of the most fundamental problems of modern natural science is the direct observation of atomic m...
Scanning electron microscopy (SEM) represents a powerful tool for studying spatial structures in con...
The development of a dynamic environmental transmission electron microscope (DETEM) at the Universit...
Three instruments for femtosecond electron diffraction (FED) experiments were erected, partially com...
AbstractAn in situ ion irradiation transmission electron microscope has been developed and is operat...
This thesis is dedicated to the development of a beam blanker for Ultrafast Electron Microscopy. Ult...
The highly energetic electrons in a transmission electron microscope (TEM) can alter or even complet...