Replacing Error Vector Magnitude Test with RF and Analog BISTs

THE INSATIABLE DEMAND to access information while people are on the go has led to the integration of RF and digital circuitry in a single CMOS SoC solution. These complex devices have traditionally required complicated testing techniques to verify the functionality of multiple radios, such as Blue-tooth, FM, GPS, and/or wireless LAN (WLAN), as well as digital circuitry in the production environ-ment. The digital portion of these devices has long benefited from scan-chain and stuck-at testing meth-ods to detect the limited types of digital faults. The an-alog and RF portions of such devices, however, have been restricted to complex parametric tests to accu-rately identify performance marginalities caused by production variations