Abstract-This survey deals with l/f noise in homogeneous semiconductor samples. A distinction is made between mobility noise and number noise. It is shown that there always is mobility noise with an (Y value with a magnitude in the order of Damaging the crystal has a strong influence on cy, cy may increase by orders of magnitude. Some theoretical models are briefly discussed; none of them can explain all experimental results. The cy values of several semi-conductors are given. These values can be used in calculations of l/f noise in devices. inhomogeneous and often nonlinear devices. For the same reason, values obtained from devices are excluded from Fig. 5 at the end of this paper. nere we present reliable data, Obtained from homogenous Fo...
Recent experimental studies on 1/f noise in MOS transistors are reviewed. Arguments are given for th...
Recent experimental studies on 1/f noise in MOS transistors are reviewed. Arguments are given for th...
The potential of using low-frequency noise as a diagnostic tool for semiconductor material and devic...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
The nature of l/f noise in semiconductors and metals has been analyzed in light of the information p...
Properties of 1/f noise (low frequency resistance fluctuations) are analyzed using the results of a ...
143 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Properties of l/f noise (low ...
143 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Properties of l/f noise (low ...
185 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1984.The nature of 1/f noise in se...
The measurements of 1/f noise in the weak-alloyed n-GaAs in the geometric magnetoresistance and heat...
Some experimental techniques for low-frequency resistance noise measurements are discussed. The crit...
Recent experimental studies on 1/f noise in MOS transistors are reviewed. Arguments are given for th...
Recent experimental studies on 1/f noise in MOS transistors are reviewed. Arguments are given for th...
The potential of using low-frequency noise as a diagnostic tool for semiconductor material and devic...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
This survey deals with 1/f noise in homogeneous semiconductor samples. A distinction is made between...
The nature of l/f noise in semiconductors and metals has been analyzed in light of the information p...
Properties of 1/f noise (low frequency resistance fluctuations) are analyzed using the results of a ...
143 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Properties of l/f noise (low ...
143 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1986.Properties of l/f noise (low ...
185 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1984.The nature of 1/f noise in se...
The measurements of 1/f noise in the weak-alloyed n-GaAs in the geometric magnetoresistance and heat...
Some experimental techniques for low-frequency resistance noise measurements are discussed. The crit...
Recent experimental studies on 1/f noise in MOS transistors are reviewed. Arguments are given for th...
Recent experimental studies on 1/f noise in MOS transistors are reviewed. Arguments are given for th...
The potential of using low-frequency noise as a diagnostic tool for semiconductor material and devic...