Remote Testing and Diagnosis of System-on-Chips Using Network Management

This paper presents a new approach that allows remote testing and diagnosis of complex (Systems-on-Chip) and embedded IP cores. The approach extends both on-chip design-for-test (DFT) architectures and network management protocols to take full benefits from existing networking infrastructures. By running intensive experimentation on ITC’99 and ITC'02 design benchmarks, the efficiency of the proposed testing and diagnosis methodology is analyzed.