Add to ORKGMicrowave sensors have been adapted to measure and create an image of the complex permittivity of lossy sheet materials non-destructively. The intended application is a portable probe which can map near-surface dielectric anomalies in various types of partially conductive sheet materials commonly found in aerospace equipment. Example
Novel low loss materials are needed to achieve miniaturization and further advances in wireless comm...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
Dielectric materials are the backbone of all high frequency communicatiol1 devices and circuits. The...
Microwave sensors have been adapted to measure and create an image of the complex permittivity of lo...
In this contribution, we are investigating a technique for the representation of electromagnetic fie...
In this contribution, we are investigating a technique for the representation of electromagnetic fie...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
The main purpose of this thesis is to propose a broadband miniaturized spectroscopy system to detect...
It is important to be able to accurately evaluate the electrical properties of dielectric materials ...
This paper describes traceable measurements of the dielectric permittivity and loss tangent of a mul...
A successful method of screening high-dielectric-constant, nonmagnetic, high-loss-factor materials a...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX85342 / BLDSC - British Library Do...
The characterization of dielectric materials is of great importance for many applications, being for...
Abstract—A new probe for the in situ measurement of the com-plex dielectric constant of materials in...
This paper describes a method to accurately determine the electromagnetic material properties of thi...
Novel low loss materials are needed to achieve miniaturization and further advances in wireless comm...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
Dielectric materials are the backbone of all high frequency communicatiol1 devices and circuits. The...
Microwave sensors have been adapted to measure and create an image of the complex permittivity of lo...
In this contribution, we are investigating a technique for the representation of electromagnetic fie...
In this contribution, we are investigating a technique for the representation of electromagnetic fie...
The precise microwave characterization of dielectric materials is an important issue for emerging te...
The main purpose of this thesis is to propose a broadband miniaturized spectroscopy system to detect...
It is important to be able to accurately evaluate the electrical properties of dielectric materials ...
This paper describes traceable measurements of the dielectric permittivity and loss tangent of a mul...
A successful method of screening high-dielectric-constant, nonmagnetic, high-loss-factor materials a...
SIGLEAvailable from British Library Document Supply Centre- DSC:DX85342 / BLDSC - British Library Do...
The characterization of dielectric materials is of great importance for many applications, being for...
Abstract—A new probe for the in situ measurement of the com-plex dielectric constant of materials in...
This paper describes a method to accurately determine the electromagnetic material properties of thi...
Novel low loss materials are needed to achieve miniaturization and further advances in wireless comm...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
Dielectric materials are the backbone of all high frequency communicatiol1 devices and circuits. The...