MODELING AND SIMULATION OF CONDUCTING CRACK PROPAGATION IN FERROELECTRIC SINGLE CRYSTALS UNDER PURELY ELECTRICAL LOADING

Abstract. We present a phase-field model of fracture in ferroelectric single crystals for the simulation of conducting crack propagation under purely electrical loading. This is done by introducing the electrical enthalpy of a diffuse conducting layer into the phase-field for-mulation. Simulation results show an oblique crack propagation and crack branching from a conducting notch in a ferroelectric sample under applied electric fields. Microstructure evolution indicates the formation of 90o domains which results in a charge accumulation around the crack. The charge accumulation, in turn, induces a high electric field and hence a high electrostatic energy for driving the conducting crack.