A multi-element, time-dependent model is used to examine additive-assisted copper electroplating in macro-channels. This model is an adaptation of the work of Akolkar and Landau [J. Electrochem. Soc., 156, D351 (2009)], used to describe plating in micro-vias for integrated circuits. Using their method for describing species movement in the channel, the model has been expanded to include transport and adsorption limitations of the inhibitor and accelerator, as well as the copper ions in solution. The model is used to investigate copper plating as an infiltration method across many size scales and aspect ratios. Biomorphic graphite scaffolds produced from wood are used as a representative system and the results of a two-additive bath are used...
Electrochemical behaviors of the base electrolyte containing different additives were investigated b...
The primary current distribution and the resistance of a modified Hull cell are calculated by using ...
405 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.In the last chapter, copper e...
A multi-element, time-dependent model is used to examine additive-assisted copper electroplating in ...
A multi-element, time-dependent model developed by Childers et al. [A.S. Childers, M.T. Johnson, J. ...
Nowadays, high performance of integrated circuits is owing its interconnections and packaging techno...
This work explores the mechanism of microvia filling by copper electroplating using a printed circui...
281 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.A simple copper deposition mo...
In the electrochemical deposition of copper on structured substrates, additives are commonly used as...
The effects of additives in copper electrodeposition have been studied by using the multi-scale kine...
The desorption / adsorption of suppressor additive during Cu electroplating plays a critical role in...
In a previous study, we achieved the bottom-up via-filling during copper electrodeposition using a s...
Damascene copper is rapidly replacing aluminum as the interconnect material of choice in silicon tec...
this paper, values of the parameters associated with the various steps in the overall reaction mecha...
In the recent years, copper has been replacing aluminum to be widely used as the interconnect materi...
Electrochemical behaviors of the base electrolyte containing different additives were investigated b...
The primary current distribution and the resistance of a modified Hull cell are calculated by using ...
405 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.In the last chapter, copper e...
A multi-element, time-dependent model is used to examine additive-assisted copper electroplating in ...
A multi-element, time-dependent model developed by Childers et al. [A.S. Childers, M.T. Johnson, J. ...
Nowadays, high performance of integrated circuits is owing its interconnections and packaging techno...
This work explores the mechanism of microvia filling by copper electroplating using a printed circui...
281 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2000.A simple copper deposition mo...
In the electrochemical deposition of copper on structured substrates, additives are commonly used as...
The effects of additives in copper electrodeposition have been studied by using the multi-scale kine...
The desorption / adsorption of suppressor additive during Cu electroplating plays a critical role in...
In a previous study, we achieved the bottom-up via-filling during copper electrodeposition using a s...
Damascene copper is rapidly replacing aluminum as the interconnect material of choice in silicon tec...
this paper, values of the parameters associated with the various steps in the overall reaction mecha...
In the recent years, copper has been replacing aluminum to be widely used as the interconnect materi...
Electrochemical behaviors of the base electrolyte containing different additives were investigated b...
The primary current distribution and the resistance of a modified Hull cell are calculated by using ...
405 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2005.In the last chapter, copper e...