SEE PROFILE

Abstract-Long Josephson junctions of width down to less than 0.3 pm are fabricated using electron beam lithography. The junctions are made in niobium-aluminum-oxide trilayer technology using cross-linked PMMA for insulation. We measured the fluxon pen-etration field, the magnetic field period of the criti-cal current modulation, and the Fiske step voltages of the junctions. A strong dependence of these quanti-ties on the junction width is observed. Assuming a general-type relation between the spatial derivative of the phase and the spatial variation of the magnetic field along the plane of the junction, we derive a scal-ing relation between the measured quantities depend-ing on the junction width. The derived relation is consistent with the experimental data. I