Abstract. Previous experimental research has shown that microstructural features such as interfaces, inclusions, vacancies and heterogeneities can all act as void nucleation sites. However, it is not well understood how important these interfaces are to the damage evolution as a function of the surrounding parent materials. In this work, we present results on three different materials: 1) Cu, 2) Cu-10 wt%Ag, and 3) Cu-15 wt%Nb examined to probe the influence of bi-metal interfaces on void nucleation and evolution. These materials were chosen due to the differences in the stacking fault energy between the two phases. The initial results suggest that when there are significant differences between the bulk properties (for example: stacking fau...
The study of void nucleation in four α/β titanium alloys has provided nucleation criteria correspond...
Phase nucleation and evolution is a problem of critical importance in many applications. As the leng...
For pursuing a more comprehensive mechanism of void formation at the Sn/Cu interface, different grai...
Previous experimental research has shown that microstructural features such as interfaces, inclusion...
Molecular dynamics (MD) simulations are carried out to investigate the effects of the type and spaci...
Design of next-generation high strength metallic materials for damage-resistant applications relies ...
Interfaces play an important role in material properties such as strength, cracking/fracture, work h...
International audienceDual-phase materials often show damage nucleation along the interface between ...
151 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004.In Bi-containing solder inter...
Interface engineering has become an important strategy for designing radiation-resistant materials. ...
By tuning consistent potentials for bimetal system, the cooperative roles of stacking fault energies...
The nucleation of lattice dislocations and interface sliding at bimetal interfaces are two fundament...
This paper reviews the role of void nucleation, growth, and coalescence on the spall failure process...
Irradiation hardening due to voids can be a significant result of radiation damage in metals, but tr...
In recent years, significant progress has been made in understanding the void growth and swelling be...
The study of void nucleation in four α/β titanium alloys has provided nucleation criteria correspond...
Phase nucleation and evolution is a problem of critical importance in many applications. As the leng...
For pursuing a more comprehensive mechanism of void formation at the Sn/Cu interface, different grai...
Previous experimental research has shown that microstructural features such as interfaces, inclusion...
Molecular dynamics (MD) simulations are carried out to investigate the effects of the type and spaci...
Design of next-generation high strength metallic materials for damage-resistant applications relies ...
Interfaces play an important role in material properties such as strength, cracking/fracture, work h...
International audienceDual-phase materials often show damage nucleation along the interface between ...
151 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 2004.In Bi-containing solder inter...
Interface engineering has become an important strategy for designing radiation-resistant materials. ...
By tuning consistent potentials for bimetal system, the cooperative roles of stacking fault energies...
The nucleation of lattice dislocations and interface sliding at bimetal interfaces are two fundament...
This paper reviews the role of void nucleation, growth, and coalescence on the spall failure process...
Irradiation hardening due to voids can be a significant result of radiation damage in metals, but tr...
In recent years, significant progress has been made in understanding the void growth and swelling be...
The study of void nucleation in four α/β titanium alloys has provided nucleation criteria correspond...
Phase nucleation and evolution is a problem of critical importance in many applications. As the leng...
For pursuing a more comprehensive mechanism of void formation at the Sn/Cu interface, different grai...