Temperature Rise of a Superconducting Oxide Bi2Sr2CaCu2O8 Sample during Argon Ion Milling

The thermal power emitted from the surface of a thin Bi2Sr2CaCu20g high temperature superconductor sample is measured under commonly employed argon milling conditions. The highest values of beam current and applied voltage induce temperature rises that do not exceed 403 + 5 K. Obtained values are close to the temperature rises usually found in the core of different ion milled thin samples. Key words: ion milling, emitted thermal power, thermoviewer Possible sample temperature rise during ion milling is a significant factor and may affect the microstructure of electron microscope specimens. Specimen temperatures during ion milling of silicon, gallium arsenide and Indium phosphide specimen in a Gatan 600 TMP Duo Ion Mill** have been reported for argon and iodine sputtering ions.1' Typical temperatures of silicon specimen preparation remain lower than 413 K. We report here the temperature evolution at the surface of a superconducting oxid