doi:10.1088/1367-2630/9/7/225 Abstract. We present mechanical Q-factors (quality factors) of a crystalline quartz test mass with a nano-structured surface, measured in the temperature regime from 5 to 300 K. The nano-structure was a grating with a period of 2 µm and a depth of about 0.1 µm. Comparative measurements were performed on the plain substrate and on the structured test mass with different numbers of SiO2/Ta2O5 coating layers. The measurements at different stages of the test mass fabrication process show that the surface distortion induced by the nanostructure does not severely lower the mechanical Q-factor of the substrate. Damping due to a multi-layer coating stack was found to be orders of magnitude higher. The results provide v...
The quartz crystal microbalance (QCM) technique is a powerful probe of interfacial phenomena that ha...
Nanometrology refers to measurement techniques that assess materials properties at the nanoscale. La...
The mechanical properties of thin films are often different from the bulk properties of the same mat...
We present mechanical Q-factors (quality factors) of a crystalline quartz test mass with a nano-stru...
Design and validation of a quartz-crystal resonator nanotribometer. This report presents the design...
Future gravitational wave detectors will be limited by different kinds of noise. Thermal noise from ...
The quartz crystal microbalance (QCM) is an ultra-sensitive weighing device. It consists of a piezoe...
Current interferometric gravitational wave detectors (IGWDs) are operated at room temperature with t...
International audienceAn experimental study of the variation of quality factor (Q-factor) of mm-size...
International audienceThermal noise of the mirrors limits the sensitivity of interferometric gravita...
Thermal noise of the mirrors limits the sensitivity of interferometric gravitational-wave detectors ...
Future generations of gravitational wave interferometers are likely to be operated at cryogenic temp...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
Thermal noise in the mirror substrates is expected to be the main limit to the VIRGO sensitivity in ...
A quartz crystal microbalance (QCM) is an acoustic transducer that sends an electronic signal when a...
The quartz crystal microbalance (QCM) technique is a powerful probe of interfacial phenomena that ha...
Nanometrology refers to measurement techniques that assess materials properties at the nanoscale. La...
The mechanical properties of thin films are often different from the bulk properties of the same mat...
We present mechanical Q-factors (quality factors) of a crystalline quartz test mass with a nano-stru...
Design and validation of a quartz-crystal resonator nanotribometer. This report presents the design...
Future gravitational wave detectors will be limited by different kinds of noise. Thermal noise from ...
The quartz crystal microbalance (QCM) is an ultra-sensitive weighing device. It consists of a piezoe...
Current interferometric gravitational wave detectors (IGWDs) are operated at room temperature with t...
International audienceAn experimental study of the variation of quality factor (Q-factor) of mm-size...
International audienceThermal noise of the mirrors limits the sensitivity of interferometric gravita...
Thermal noise of the mirrors limits the sensitivity of interferometric gravitational-wave detectors ...
Future generations of gravitational wave interferometers are likely to be operated at cryogenic temp...
We performed noise measurements to obtain the quality factor (Q) and frequency shift of gold coated ...
Thermal noise in the mirror substrates is expected to be the main limit to the VIRGO sensitivity in ...
A quartz crystal microbalance (QCM) is an acoustic transducer that sends an electronic signal when a...
The quartz crystal microbalance (QCM) technique is a powerful probe of interfacial phenomena that ha...
Nanometrology refers to measurement techniques that assess materials properties at the nanoscale. La...
The mechanical properties of thin films are often different from the bulk properties of the same mat...