A multifunctional tool which expands the application field of atomic force microscope-based surface modification is presented. The AFM-probe can be used for surface modification and in-situ characterization at the same time, due to a special configuration with two cantilevers. Various applications from different fields are presented, which were carried out with one and the same tool: in-situ characterization o f wear generated with and without local lubrication (tribology), fountain-pen lithography in which material is deposited or removed (physical-chemistry), and electrochemical metal deposition (electro-chemistry)
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic)...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Atomic force microscopy (AFM) is a high-resolution imaging technique that uses a small probe (tip an...
A multifunctional tool which expands the application field of atomic force microscope-based surface ...
An innovative tool has been developed to investigate in-situ monitoring of surface modification, whi...
The atomic force microscope (AFM), a prominent member of the new class of scanning near-field micros...
We present the fabrication process of a tool that can be used in standard atomic force microscope (A...
The invention of the atomic force microscope allowed, for the first time, high resolution imaging of...
iAbstract The goal of this thesis is create a scanning probe microscopy (SPM) platform for multifunc...
The microfabrication process for cantilever probes for combined atomic force (AFM) and scanning near...
The imaging of objects by standard bright field microscopy is limited by the wavelength of light. A ...
Atomic force microscopy (AFM) was developed in 1986. It is an important and versatile surface techni...
A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to ...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 20...
The goal of this thesis is create a scanning probe microscopy (SPM) platform for multifunctional pro...
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic)...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Atomic force microscopy (AFM) is a high-resolution imaging technique that uses a small probe (tip an...
A multifunctional tool which expands the application field of atomic force microscope-based surface ...
An innovative tool has been developed to investigate in-situ monitoring of surface modification, whi...
The atomic force microscope (AFM), a prominent member of the new class of scanning near-field micros...
We present the fabrication process of a tool that can be used in standard atomic force microscope (A...
The invention of the atomic force microscope allowed, for the first time, high resolution imaging of...
iAbstract The goal of this thesis is create a scanning probe microscopy (SPM) platform for multifunc...
The microfabrication process for cantilever probes for combined atomic force (AFM) and scanning near...
The imaging of objects by standard bright field microscopy is limited by the wavelength of light. A ...
Atomic force microscopy (AFM) was developed in 1986. It is an important and versatile surface techni...
A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to ...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 20...
The goal of this thesis is create a scanning probe microscopy (SPM) platform for multifunctional pro...
The atomic force microscope (AFM) is designed to provide high-resolution (in the ideal case, atomic)...
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2015.Cata...
Atomic force microscopy (AFM) is a high-resolution imaging technique that uses a small probe (tip an...