We present the electrical characterization of an autonomous non-volatile ferroelectric memory latch using the principle that when an electric field is applied to a ferroelectriccapacitor,the positive and negative remnant polarization charge states of the capacitor are denoted as either data 0 or data 1. The properties of the ferroelectric material to store an electric polarization in the absence of an electric field make the device non-volatile. Further the memory latch is autonomous as it operates with the ground, power and output node connections, without any externally clocked control line. The unique quality of this latch circuit is that it can be written when powered off. The advantages of this latch over flash memories are: a) It offe...
The characteristic property of ferroelectric materials, which is the reversal of polarization by an ...
The properties of ferroelectric materials, which were discovered almost a century ago¹ , have led to...
We investigated the reading and writing of ferroelectric-gate field-effect transistor memory with an...
Ferroelectricity is a material property were a remanent polarization exists under zero electrical fi...
A new concept for using a ferroelectric field effect transistor in a memory configuration is present...
Thesis (S.B. and S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and C...
The polarization reversal in ferroelectric HfO₂ is adopted to store information in three distinct de...
Ferroelectric random access memory (FRAM) is a two-state non-volatile memory, in which information i...
We report the electrical characteristics of metal-ferroelectric-insulator-semiconductor structures, ...
The electric-field-driven and reversible polarization switching in ferroelectric materials provides ...
Ferroic-order parameters are useful as state variables in non-volatile information storage media bec...
A memory functionality is a prerequisite for many applications of electronic devices. Organic nonvol...
Ferroic-order parameters are useful as state variables in non-volatile information storage media bec...
DoctorAs the production of information increases, there is an increasing demand for a high-performan...
Because of the thermal distribution of electrons in a semiconductor, modern transistors cannot be tu...
The characteristic property of ferroelectric materials, which is the reversal of polarization by an ...
The properties of ferroelectric materials, which were discovered almost a century ago¹ , have led to...
We investigated the reading and writing of ferroelectric-gate field-effect transistor memory with an...
Ferroelectricity is a material property were a remanent polarization exists under zero electrical fi...
A new concept for using a ferroelectric field effect transistor in a memory configuration is present...
Thesis (S.B. and S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and C...
The polarization reversal in ferroelectric HfO₂ is adopted to store information in three distinct de...
Ferroelectric random access memory (FRAM) is a two-state non-volatile memory, in which information i...
We report the electrical characteristics of metal-ferroelectric-insulator-semiconductor structures, ...
The electric-field-driven and reversible polarization switching in ferroelectric materials provides ...
Ferroic-order parameters are useful as state variables in non-volatile information storage media bec...
A memory functionality is a prerequisite for many applications of electronic devices. Organic nonvol...
Ferroic-order parameters are useful as state variables in non-volatile information storage media bec...
DoctorAs the production of information increases, there is an increasing demand for a high-performan...
Because of the thermal distribution of electrons in a semiconductor, modern transistors cannot be tu...
The characteristic property of ferroelectric materials, which is the reversal of polarization by an ...
The properties of ferroelectric materials, which were discovered almost a century ago¹ , have led to...
We investigated the reading and writing of ferroelectric-gate field-effect transistor memory with an...