Add to ORKGThe purpose of this presentation is to: Highlight space memory evaluation evolution, Review recent developments regarding low-energy proton direct ionization soft errors, Assess current space memory evaluation challenges, including increase of non-volatile technology choices, and Discuss related testing and evaluation complexities
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...
Inclusion of commercial technologies in civil spaceflight applications is reality. These technologie...
The USU Materials Physics Group (MPG) has conducted survivability tests of the effects of space and ...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
Soft errors resulting from the impact of charged particles are emerging as a major issue in the desi...
Down-scaling of the supply voltage is considered as the most effective means of reducing the power- ...
Abstract Spacecraft performance requirements drive the utilization of commercial-off-the-shelf (COTS...
We report low-energy proton and low-energy alpha particle single-event effects (SEE) data on a 32 nm...
We use ray tracing software to model various levels of spacecraft shielding complexity and energy de...
Radiation requirements and trends. TID: 1) >90% of NASA applications are < 100 krads-Si in piecepart...
Commercial nonvolatile memory technology is attractive for space applications, but radiation issues ...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...
Inclusion of commercial technologies in civil spaceflight applications is reality. These technologie...
The USU Materials Physics Group (MPG) has conducted survivability tests of the effects of space and ...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
Soft errors resulting from the impact of charged particles are emerging as a major issue in the desi...
Down-scaling of the supply voltage is considered as the most effective means of reducing the power- ...
Abstract Spacecraft performance requirements drive the utilization of commercial-off-the-shelf (COTS...
We report low-energy proton and low-energy alpha particle single-event effects (SEE) data on a 32 nm...
We use ray tracing software to model various levels of spacecraft shielding complexity and energy de...
Radiation requirements and trends. TID: 1) >90% of NASA applications are < 100 krads-Si in piecepart...
Commercial nonvolatile memory technology is attractive for space applications, but radiation issues ...
Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
UnrestrictedWith aggressive technology scaling, radiation-induced soft errors have become a major th...