A new algorithm to simulate a high resolution electron microscope image of a wedge-shaped crystal is developed. The image of the crystal whose thickness continuously varies is calculated in one lump. This algorithm consists of two parts. One is to calculate the wave function on the exit surface of the crystal with the multi-slice method for inclined incidence and the other is to transfer the wave function onto a certain plane perpendicular to the optical axis. This new method is applied to images of small MgO cubic crystals observed from the [110] direction by 400 kV and 200 kV high resolution electron microscopes. It is shown that the simulated images can well represent actual images. Key words = image simulation: wedge-shaped crystal: inc...
In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any i...
In a Bloch-wave-based scanning transmission electron microscope (STEM) image simulation, a framework...
Image simulation methods are applied to interpret mirror electron microscopy (MEM) images obtained f...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Abstract--High-resolution ra smission electron microscope images of dioctahedral mixed-layer clay st...
High-resolution electron microscope images were simulated for two structural models of Si crystal co...
Simulations of images of surface steps obtained by high energy reflection electron microscopy are pr...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Computer simulation of electron micrographs is an invaluable aid in their proper interpretation and ...
At present it is difficult to use direct image processing techniques to determine the specimen struc...
This thesis is concerned with the discussion of the limitations and the opportunities of super-resol...
Quantum-mechanical multiple scattering theory of electron backscattering from crystalline materials ...
This thesis is pointed on simulation of electron microscope. It uses knowledge from ray-tracing met...
A full, three{dimensional (3D) ray tracing approach is developed to simulate the caustics visible i...
The objective of this project is to study on the variables that could have an effect on the resoluti...
In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any i...
In a Bloch-wave-based scanning transmission electron microscope (STEM) image simulation, a framework...
Image simulation methods are applied to interpret mirror electron microscopy (MEM) images obtained f...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Abstract--High-resolution ra smission electron microscope images of dioctahedral mixed-layer clay st...
High-resolution electron microscope images were simulated for two structural models of Si crystal co...
Simulations of images of surface steps obtained by high energy reflection electron microscopy are pr...
Image simulation for scanning transmission electron microscopy at atomic resolution for samples with...
Computer simulation of electron micrographs is an invaluable aid in their proper interpretation and ...
At present it is difficult to use direct image processing techniques to determine the specimen struc...
This thesis is concerned with the discussion of the limitations and the opportunities of super-resol...
Quantum-mechanical multiple scattering theory of electron backscattering from crystalline materials ...
This thesis is pointed on simulation of electron microscope. It uses knowledge from ray-tracing met...
A full, three{dimensional (3D) ray tracing approach is developed to simulate the caustics visible i...
The objective of this project is to study on the variables that could have an effect on the resoluti...
In a Bloch-wave-based STEM image simulation, a framework for calculating the cross section for any i...
In a Bloch-wave-based scanning transmission electron microscope (STEM) image simulation, a framework...
Image simulation methods are applied to interpret mirror electron microscopy (MEM) images obtained f...