Capability indices are dimensionless quantities measuring the aptitude of a process to manufacture items whose characteristics must be within a specified tolerance ranges. The usual indices pC, pkC, pmC, and pmkC are used for a process of normal distribution and a target located at the center of the tolerance interval. Various indices derived from the previous family allow to consider more complex situations when asymmetrical tolerances and non-normal distributions are taken into account. In this paper we study the case where a single tolerance is imposed because the shifts in the direction of this tolerance appear much more serious than in the opposite direction. We propose a family of four indices having interpretations and properties sim...
Tolerance Charting has been used traditionally to find out the working dimensions and allocate produ...
[[abstract]]Process capability indices had been widely used to evaluate the process performance. The...
The properties of C_p_m_k in the presence of asymmetric specification limits are discussed. It is sh...
For a non-normal Pearsonian population, Clements suggests a method to estimate the usual capability ...
The classical process capability indices are still the most prominently used by practitioners for as...
6 pagesInternational audienceToday, the capability study is a universally recognized method to forma...
Positional characteristics can be found in many manufactured products. This type of quality characte...
A new class of capability indices, containing $C\sb p$, $C\sbpk$, $C\sbpm$, and $C\sbpmk$, is define...
Most research works related to process capability indices assume no gauge measurement errors. Howeve...
In the manufacturing industry, many product characteristics are of one-sided tolerances. The process...
[[abstract]]The process capability index which is a generalization of is defined by the use of the i...
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufactu...
Abstract--Process capability indices Cp(u, v), which include the four basic indices Cp, Cpk, Cpm and...
For nonnormal data, there exists no standard calculation for the process capability. Many different ...
In discussion of process capability indices for normal and non-normal processes with symmetrical and...
Tolerance Charting has been used traditionally to find out the working dimensions and allocate produ...
[[abstract]]Process capability indices had been widely used to evaluate the process performance. The...
The properties of C_p_m_k in the presence of asymmetric specification limits are discussed. It is sh...
For a non-normal Pearsonian population, Clements suggests a method to estimate the usual capability ...
The classical process capability indices are still the most prominently used by practitioners for as...
6 pagesInternational audienceToday, the capability study is a universally recognized method to forma...
Positional characteristics can be found in many manufactured products. This type of quality characte...
A new class of capability indices, containing $C\sb p$, $C\sbpk$, $C\sbpm$, and $C\sbpmk$, is define...
Most research works related to process capability indices assume no gauge measurement errors. Howeve...
In the manufacturing industry, many product characteristics are of one-sided tolerances. The process...
[[abstract]]The process capability index which is a generalization of is defined by the use of the i...
Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufactu...
Abstract--Process capability indices Cp(u, v), which include the four basic indices Cp, Cpk, Cpm and...
For nonnormal data, there exists no standard calculation for the process capability. Many different ...
In discussion of process capability indices for normal and non-normal processes with symmetrical and...
Tolerance Charting has been used traditionally to find out the working dimensions and allocate produ...
[[abstract]]Process capability indices had been widely used to evaluate the process performance. The...
The properties of C_p_m_k in the presence of asymmetric specification limits are discussed. It is sh...