Add to ORKGThis slide presentation reviews the single event upset static testing of the Virtex II field programmable gate arrays (FPGA) that were tested in protons and heavy-ions. The test designs and static and dynamic test results are reviewed
The performance, in-system reprogrammability, flexibility, and reduced costs of SRAM-based field-pro...
FPGAs are an attractive alternative for many space-based computing operations. While radiation harde...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
Static random access memory (SRAM) upset rates in field programmable gate arrays (FPGAs) from the Xi...
Total ionizing dose (TID), heavy ion and proton characterization have previously been performed on V...
The Xilinx Virtex-II Pro is a platform FPGA that embeds multiple microprocessors within the fabric o...
Abstract portability and reuse by providing consistent and Heavy ion testing of the Xilinx Virtex II...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
SRAM based logic devices such as FPGAs have some susceptibility to SEU and functional interruption. ...
A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Dif...
We present initial results for the thin epitaxial Xilinx Virtex-4 Fie ld Programmable Gate Array (FP...
This paper discusses the application of Space Micro‘s Time-Triple Modular Redundancy (TTMR™) and Har...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
SRAM based logic devices such as FPGAs have some susceptibility to SEU and functional interruption. ...
The performance, in-system reprogrammability, flexibility, and reduced costs of SRAM-based field-pro...
FPGAs are an attractive alternative for many space-based computing operations. While radiation harde...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
Static random access memory (SRAM) upset rates in field programmable gate arrays (FPGAs) from the Xi...
Total ionizing dose (TID), heavy ion and proton characterization have previously been performed on V...
The Xilinx Virtex-II Pro is a platform FPGA that embeds multiple microprocessors within the fabric o...
Abstract portability and reuse by providing consistent and Heavy ion testing of the Xilinx Virtex II...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
SRAM based logic devices such as FPGAs have some susceptibility to SEU and functional interruption. ...
A heavy ion radiation test has been performed to evaluate the SEU sensitivity of Virtex devices. Dif...
We present initial results for the thin epitaxial Xilinx Virtex-4 Fie ld Programmable Gate Array (FP...
This paper discusses the application of Space Micro‘s Time-Triple Modular Redundancy (TTMR™) and Har...
International audienceA sensitivity characterization of a Xilinx Artix-7 field programmable gate arr...
SRAM based logic devices such as FPGAs have some susceptibility to SEU and functional interruption. ...
The performance, in-system reprogrammability, flexibility, and reduced costs of SRAM-based field-pro...
FPGAs are an attractive alternative for many space-based computing operations. While radiation harde...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...