The detection and classification of faults is a major task for optical nondestructive testing in industrial quality control. Interferometric fringes, obtained by real-time optical measurement methods, contain a large amount of image data with information about possible defect features. This mass of data must be reduced for further evaluation. One possible way is the filtering of these images applying the adaptive wavelet transform. The wavelet transform has been proved to be a capable tool in the detection of structures with definite spatial resolution. In this paper it is shown the extraction and classification of disturbances in interferometric fringe patterns, the application of several wavelet functions with different parameters for the...
Nowadays the demands on quality control are constantly increasing, hence an important step is a comp...
International audienceWe present a method based on local regularity analysis to detect glitch signat...
International audienceWe present a method based on local regularity analysis to detect glitch signat...
This paper proposes the use of the wavelet transform as a technique that is suited for fringe detect...
International audienceAn innovative signal processing method based on custom-made wavelet transform ...
In optical nondestructive testing, a novel solution is presented for fault detection based on the in...
International audienceAn innovative signal processing method based on custom-made wavelet transform ...
Optical metrology and interferometry are widely known disciplines that study and develop techniques...
Present inspection techniques in the semiconductor industry are generally serial in nature. As a res...
Present inspection techniques in the semiconductor industry are generally serial in nature. As a res...
International audienceA novel signal processing method based on custom-made Wavelet Transform (WT) i...
An innovative signal processing method based on custom-made wavelet transform (WT) is presented for ...
A hybrid measurement technique is proposed for high-precision surface inspection. The technique uses...
Present inspection techniques in the semiconductor industry are generally serial in nature. As a res...
A new technique is presented, dynamic phase-shifting, which is based on a dedicated phase-shifting a...
Nowadays the demands on quality control are constantly increasing, hence an important step is a comp...
International audienceWe present a method based on local regularity analysis to detect glitch signat...
International audienceWe present a method based on local regularity analysis to detect glitch signat...
This paper proposes the use of the wavelet transform as a technique that is suited for fringe detect...
International audienceAn innovative signal processing method based on custom-made wavelet transform ...
In optical nondestructive testing, a novel solution is presented for fault detection based on the in...
International audienceAn innovative signal processing method based on custom-made wavelet transform ...
Optical metrology and interferometry are widely known disciplines that study and develop techniques...
Present inspection techniques in the semiconductor industry are generally serial in nature. As a res...
Present inspection techniques in the semiconductor industry are generally serial in nature. As a res...
International audienceA novel signal processing method based on custom-made Wavelet Transform (WT) i...
An innovative signal processing method based on custom-made wavelet transform (WT) is presented for ...
A hybrid measurement technique is proposed for high-precision surface inspection. The technique uses...
Present inspection techniques in the semiconductor industry are generally serial in nature. As a res...
A new technique is presented, dynamic phase-shifting, which is based on a dedicated phase-shifting a...
Nowadays the demands on quality control are constantly increasing, hence an important step is a comp...
International audienceWe present a method based on local regularity analysis to detect glitch signat...
International audienceWe present a method based on local regularity analysis to detect glitch signat...