Add to ORKGWe present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and ...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Abstract We present both heavy ion and proton single event effect (SEE) ground test results for cand...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Abstract-- Sensitivity of a variety of candidate spacecraft electronics to total ionizing dose and d...
We present the results of single event effect (SEE) testing and analysis investigating the effects o...
We present results and analysis investigating the effects of radiation on a variety of candidate spa...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...
We present the results of Single Event Effects (SEE) testing with high energy protons and with low a...
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and ...
Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...
Abstract We present both heavy ion and proton single event effect (SEE) ground test results for cand...
We present the results of single events effects (SEE) testing and analysis investigating the effects...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Abstract-- Sensitivity of a variety of candidate spacecraft electronics to total ionizing dose and d...
We present the results of single event effect (SEE) testing and analysis investigating the effects o...
We present results and analysis investigating the effects of radiation on a variety of candidate spa...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Total ionizing dose, displacement damage dose, and single-event effect testing were performed to cha...
We present the results of Single Event Effects (SEE) testing with high energy protons and with low a...
This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests ...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displaceme...