Add to ORKGLicense, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. Electronic equipment operating in harsh environments such as space is subjected to a range of threats.Themost important of these is radiation that gives rise to permanent and transient errors onmicroelectronic components.The occurrence rate of transient errors is significantly more than permanent errors. The transient errors, or soft errors, emerge in two formats: control flow errors (CFEs) and data errors. Valuable research results have already appeared in literature at hardware and software levels for their alleviation. However, there is the basic assumption behind these works that the operating system is re...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
As DRAM is facing the scaling difficulty in terms of energy cost and reliability, some nonvol-atile ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
In the modern era of computing, processors are increasingly susceptible to soft errors. Current solu...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
As high-performance computing (HPC) continues to progress, constraints on HPC system design forces t...
Minimizing the risk of system failure in any computer structure requires identifying those component...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
As DRAM is facing the scaling difficulty in terms of energy cost and reliability, some nonvol-atile ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Soft error in static random-access memory (SRAM) caused by radiation has been shown to be one of the...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
In the modern era of computing, processors are increasingly susceptible to soft errors. Current solu...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
Embedded systems are used for both safety and non-safety critical applications. Safety critical syst...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
As high-performance computing (HPC) continues to progress, constraints on HPC system design forces t...
Minimizing the risk of system failure in any computer structure requires identifying those component...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
System reliability has become a key design aspect for computer systems due to the aggressive technol...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
As DRAM is facing the scaling difficulty in terms of energy cost and reliability, some nonvol-atile ...