Comprehensive Cell, I/O and Memory Characterization Overview

is a comprehensive characterization solution for standard cells, I/O, complex cells and memory. It generates accurate model libraries tightly correlated with Synopsys ’ digital implementation tools. Its built-in FineSim ™ simulation technology and tight integration with the gold-standard HSPICE ® circuit simulator enable characterization and signoff accuracy. SiliconSmart supports all of the standard models, including NLDM (non-linear delay model), CCS (composite current source) and AOCV (advanced on-chip variation) models