Add to ORKGThis application note presents a primer on the direct and reverse piezoelectric effects and their uses, and the instrumentation and applications of piezoresponse force microscopy. Piezoelectricit
Detection of surface forces between a tip and sample has been demonstrated with a piezoelectric cant...
Surface displacements of a few picometers, occurring after application of an electric potential to p...
Resumen del póster presentado a la 10th Conferencia Fuerzas y Túnel, celebrada en Girona (España) de...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytic...
Electromechanical coupling, including piezoelectricity, ferroelectricity, and flexoelectricity, is p...
The ability to reliably measure electromechanical properties is crucial to the advancement of materi...
Since the rotational symmetry of an electric field induced by piezoresponse force microscopy (PFM) c...
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation a...
The objective of this work was to understand the effect of the movable electrode (the tip of an atom...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Piezorespo...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
Detection of surface forces between a tip and sample has been demonstrated with a piezoelectric cant...
Surface displacements of a few picometers, occurring after application of an electric potential to p...
Resumen del póster presentado a la 10th Conferencia Fuerzas y Túnel, celebrada en Girona (España) de...
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe ti...
Piezoresponse force microscopy (PFM) probes the mechanical deformation of a sample in response to an...
In order to determine the origin of image contrast in piezoresponse force microscopy (PFM), analytic...
Electromechanical coupling, including piezoelectricity, ferroelectricity, and flexoelectricity, is p...
The ability to reliably measure electromechanical properties is crucial to the advancement of materi...
Since the rotational symmetry of an electric field induced by piezoresponse force microscopy (PFM) c...
Piezoresponse force microscopy (PFM) is one of the most established techniques for the observation a...
The objective of this work was to understand the effect of the movable electrode (the tip of an atom...
This thesis focuses on ferroelectric thin film characterization through Piezoresponse Force Microsco...
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It ca...
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale Piezorespo...
In this paper, we review recent advances in piezoresponse force microscopy (PFM) with respect to nan...
Detection of surface forces between a tip and sample has been demonstrated with a piezoelectric cant...
Surface displacements of a few picometers, occurring after application of an electric potential to p...
Resumen del póster presentado a la 10th Conferencia Fuerzas y Túnel, celebrada en Girona (España) de...