Abstract. Microprocessor design deals with many types of specifica-tions: from functional models (SystemC or proprietary languages) to hardware description languages such as VHDL or Verilog. Functional descriptions are key to the development of new processors or System On Chips at STMicroelectronics. In this paper we address the problem of automatic generation of high quality test-suites for microprocessor functional models validation. We present the design and implementation of a software tool based on con-straint solving techniques which analyzes the control flow of the initial description in order to generate tests for each path. The test vectors are computed with a dedicated constraint solver designed to handle specific constraints rela...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
International audienceMicroprocessor design deals with many types of specifications: from functional...
Abstract. Microprocessor design deals with many types of specifications: from functional models (Sys...
International audienceMicroprocessor design deals with many types of specifications : from functiona...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
Functional design verification is one of the most serious bottlenecks in modem microprocessor design...
This paper addresses the problem of test vectors generation starting from an high level description ...
This chapter describes and analyzes a methodology for gathering together test-programs for microproc...
The widespread use of hardware/software systems in cost-critical and life-critical applications moti...
The continuous advances in microelectronics design are creating a significant challenge to design va...
Most Systems-on-a-Chips include a custom microprocessor core, and time and resource constraints make...
Coverage directed test generation is a popular method in the area of functional verification of micr...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
International audienceMicroprocessor design deals with many types of specifications: from functional...
Abstract. Microprocessor design deals with many types of specifications: from functional models (Sys...
International audienceMicroprocessor design deals with many types of specifications : from functiona...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
Functional design verification is one of the most serious bottlenecks in modem microprocessor design...
This paper addresses the problem of test vectors generation starting from an high level description ...
This chapter describes and analyzes a methodology for gathering together test-programs for microproc...
The widespread use of hardware/software systems in cost-critical and life-critical applications moti...
The continuous advances in microelectronics design are creating a significant challenge to design va...
Most Systems-on-a-Chips include a custom microprocessor core, and time and resource constraints make...
Coverage directed test generation is a popular method in the area of functional verification of micr...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...