Abstract—Online Testability is used to detect bit error of Reversible Circuit at runtime using Check circuit to propagate all errors into single line. In this paper, we propose an improved design of check circuit, Modified Test Cell (MTC) can detect error in short time and also able to identify affected cell(s) simultane-ously. We also present a cost effective design of Online Testable Ripple Carry Adder (RCA) with proposed MTC. Proposed design of check circuit is able to enhance the reusability of circuit by replacing corresponding faulty cell(s). I
529-532A new method of designing reversible circuits with inbuilt testability is presented by exploi...
The main objective of this project is to design testability features that can potentially be include...
Faulty chips will reach customer if IC testing is not performed on the fabricated IC. Simple types o...
Applications of reversible circuits can be found in the fields of low-power computation, cryptograph...
It is very important to detect and correct faults for ensuring the validity and reliability of these...
More stringent defect detection requirements have led to the creation of new fault models, such as t...
Synthesis for testability ensures that the synthesized circuit is testable by exploring the fundamen...
International audienceThe design of checkers suitable for concurrent error detection in analogue and...
In this work, we have proposed an implementation of a testable reversible adder using conservative r...
Abstract—Conventional circuit dissipates energy to reload missing information because of overlapped ...
This paper presents new logic synthesis techniques for generating multilevel circuits with concurren...
Abstract—In this work we present a novel fault-tolerant circuits design method. It combines time and...
Improved difficulty of the circuit tends to decline the reliability drastically and improved tendenc...
Abstract-Self-checking circuits can detect the presence of both transient and permanent faults. A se...
A test diagnostics method is proposed using partial duplication of a tested unit. Checking system is...
529-532A new method of designing reversible circuits with inbuilt testability is presented by exploi...
The main objective of this project is to design testability features that can potentially be include...
Faulty chips will reach customer if IC testing is not performed on the fabricated IC. Simple types o...
Applications of reversible circuits can be found in the fields of low-power computation, cryptograph...
It is very important to detect and correct faults for ensuring the validity and reliability of these...
More stringent defect detection requirements have led to the creation of new fault models, such as t...
Synthesis for testability ensures that the synthesized circuit is testable by exploring the fundamen...
International audienceThe design of checkers suitable for concurrent error detection in analogue and...
In this work, we have proposed an implementation of a testable reversible adder using conservative r...
Abstract—Conventional circuit dissipates energy to reload missing information because of overlapped ...
This paper presents new logic synthesis techniques for generating multilevel circuits with concurren...
Abstract—In this work we present a novel fault-tolerant circuits design method. It combines time and...
Improved difficulty of the circuit tends to decline the reliability drastically and improved tendenc...
Abstract-Self-checking circuits can detect the presence of both transient and permanent faults. A se...
A test diagnostics method is proposed using partial duplication of a tested unit. Checking system is...
529-532A new method of designing reversible circuits with inbuilt testability is presented by exploi...
The main objective of this project is to design testability features that can potentially be include...
Faulty chips will reach customer if IC testing is not performed on the fabricated IC. Simple types o...