sign complexity and technology scaling, soft errors have become a key design challenge. In this work, we extend the concept of ar-chitectural vulnerability factor (AVF) from the microprocessor do-main and propose a network vulnerability factor (NVF) to charac-terize the susceptibility of Network Interfaces (NIs) to soft errors. For the first time, a detailed characterization of vulnerability is performed on a state-of-the-art AXI-based NI architecture using full system simulation. Our studies reveal that different NI buffers behave quite differently in the presence of transient faults and each buffer can have different inherent tolerance to faults. Our analysis also considers the impact of thermal hotspot mitigation techniques on the NVF es...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Conventional fault-tolerance approaches for Networks-on-Chip (NoCs) cannot be applied to high depend...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Networks-on-Chip (NoCs) appeared as a strategy to deal with the communication requirements of comple...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects...
With the scale down of transistor sizes and higher frequencies with low power modes in modern archit...
Traditionally, distributed systems requiring high dependability were designed using custom hardware ...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
Network-on-Chip (NoC) is a key component in chip multiprocessors (CMPs) as it supports communication...
Due to the character of the original source materials and the nature of batch digitization, quality ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Conventional fault-tolerance approaches for Networks-on-Chip (NoCs) cannot be applied to high depend...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Networks-on-Chip (NoCs) appeared as a strategy to deal with the communication requirements of comple...
Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft erro...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects...
With the scale down of transistor sizes and higher frequencies with low power modes in modern archit...
Traditionally, distributed systems requiring high dependability were designed using custom hardware ...
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
With shrinking process technology, the primary cause of transient faults in semiconductors shifts aw...
Network-on-Chip (NoC) is a key component in chip multiprocessors (CMPs) as it supports communication...
Due to the character of the original source materials and the nature of batch digitization, quality ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Conventional fault-tolerance approaches for Networks-on-Chip (NoCs) cannot be applied to high depend...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...