Abstract—Soft Errors have emerged as a key challenge to microprocessor design. Traditional soft error tolerance techniques (such as redundant multithreading and instruction duplication) can achieve high fault coverage but at the cost of significant performance degradation. Prior research reports that soft errors can be masked at the architecture level, and the degree of such masking, named as architecture vulnerability factor (AVF), can vary significantly across workloads and individual structures, hence strict redundant execution may not be necessary for soft error tolerance. In this work, we exploit the AVF varying feature to adaptively tune reliability and performance. We present an infrastructure to online compute and predict AVF for th...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
Continuously reducing transistor sizes and aggressive low power operating modes employed by modern a...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
With the scaling of technology, transient errors caused by external particle strikes have become a c...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Continuously reducing transistor sizes and aggressive low power operating modes employed by modern a...
Research has shown that microprocessors and structures of the microprocessors are vulnerable to alph...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
Continuously reducing transistor sizes and aggressive low power operating modes employed by modern a...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Soft error reliability has become a first-order design criterion for modern microprocessors. Archite...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Single-event upsets from particle strikes have become a key challenge in microprocessor design. Tech...
Reliability to soft errors is a significant design challenge in modern microprocessors owing to an e...
Abstract—As CMOS technology scales into the nanometer era, future shipped microprocessors will be in...
Abstract—Reliability is an important design constraint in modern microprocessors, and one of the fun...
Aggressive technology scaling is increasing the impact of soft errors on microprocessor reliability....
Abstract-The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluat...
With the scaling of technology, transient errors caused by external particle strikes have become a c...
To face future reliability challenges, it is necessary to quantify the risk of error in any part of ...
Continuously reducing transistor sizes and aggressive low power operating modes employed by modern a...
Research has shown that microprocessors and structures of the microprocessors are vulnerable to alph...
This paper concerns the validity of a widely used method for estimating the architecture-level mean ...
Continuously reducing transistor sizes and aggressive low power operating modes employed by modern a...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...