A Concept for Testing and Diagnosis of Embedded Systems based on Extended Finite States Machines

Due to the growing complexity of embedded systems and their requirements in reliability and real-time capability, support methods to help designers and testers at the different phases of the development cycle are needed. In areas such network protocol testing automatic test generation has been used successfully. Here, the method of extended finite state machines is applied to embedded systems. Additionally, fault models for testing and test result analysis are given to automate error detection