Combined synchrotron X-rays and image correlation analyses of biaxially deformed W/Cu nanocomposite thin films on

Abstract In-situ biaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate thanks to a biaxial testing machine developed on the DiffAbs beamline at SOLEIL synchrotron. The mechanical behavior of the nanocomposite was characterized at the micro-scale and the macro-scale using simultaneously synchrotron X-ray diffraction and digital image correlation techniques. Strain analyses for equi-biaxial and non equi-biaxial loading paths have been performed. The results show that the two strain measurements match to within 1 × 10-4 in the elastic domain for strain levels less than 0.3 % and for both loading paths