We describe band engineering strategies to either enhance or suppress electron-initiated impact ionization relative to hole-initiated impact ionization in type II superlattice mid-wavelength infrared avalanche photodiodes. The strategy to enhance electron-initiated impact ionization involves placing a high density of states at approximately one energy gap above the bottom of the conduction band and simultaneously removing valence band states from the vicinity of one energy gap below the top of the valence band. This gives the electrons a low threshold energy and the holes a high one. The opposite strategy enhances hole-initiated impact ionization. Estimates of the electron (α) and hole (β) impact ionization coefficients predict that α/β>...
The effects of impact ionization in the InGaAs absorption layer on the multiplication, excess noise ...
The best-fitted electron and hole impact ionisation coefficients are obtained and it is found that t...
The present article deals with device physics and modeling of an Hg0.28Cd0.72Te wide-area electron-i...
The noise of an In0.53Ga0.47As/In0.52Al0.48As superlattice avalanche photodiode is measured at 700 M...
The interband impact ionization transition rate (IIR) of electrons and holes in wurtzite GaN and AlN...
A systematic study of impact ionization, avalanche multiplication, and excess noise in InAs diodes h...
An experimental investigation into impact ionization in InAs photodiodes is presented. Photomultipli...
A systematic study of impact ionization, avalanche multiplication, and excess noise in InAs diodes h...
We report the impact ionisation coefficients of the quaternary alloy Al0.9Ga0.1As0.08Sb0.92 lattice ...
Avalanche photodiodes are a classification of semiconductor devices known for their high sensitivity...
A recently developed nonlocal history dependent model for electron and hole impact ionization is use...
This thesis reports results of experimental and theoretical investigations of impact ionisation in s...
Impact ionisation coefficients are measured in In_0_._5_3Ga_0_._4_7As and excess noise characteristi...
Avalanche photodiodes (APDs) are the preferred photodetector in many applications in which low ligh...
102 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1988.Impact ionization coefficient...
The effects of impact ionization in the InGaAs absorption layer on the multiplication, excess noise ...
The best-fitted electron and hole impact ionisation coefficients are obtained and it is found that t...
The present article deals with device physics and modeling of an Hg0.28Cd0.72Te wide-area electron-i...
The noise of an In0.53Ga0.47As/In0.52Al0.48As superlattice avalanche photodiode is measured at 700 M...
The interband impact ionization transition rate (IIR) of electrons and holes in wurtzite GaN and AlN...
A systematic study of impact ionization, avalanche multiplication, and excess noise in InAs diodes h...
An experimental investigation into impact ionization in InAs photodiodes is presented. Photomultipli...
A systematic study of impact ionization, avalanche multiplication, and excess noise in InAs diodes h...
We report the impact ionisation coefficients of the quaternary alloy Al0.9Ga0.1As0.08Sb0.92 lattice ...
Avalanche photodiodes are a classification of semiconductor devices known for their high sensitivity...
A recently developed nonlocal history dependent model for electron and hole impact ionization is use...
This thesis reports results of experimental and theoretical investigations of impact ionisation in s...
Impact ionisation coefficients are measured in In_0_._5_3Ga_0_._4_7As and excess noise characteristi...
Avalanche photodiodes (APDs) are the preferred photodetector in many applications in which low ligh...
102 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1988.Impact ionization coefficient...
The effects of impact ionization in the InGaAs absorption layer on the multiplication, excess noise ...
The best-fitted electron and hole impact ionisation coefficients are obtained and it is found that t...
The present article deals with device physics and modeling of an Hg0.28Cd0.72Te wide-area electron-i...