The feasibility of carbon-silicon nitride formation (6-Sil.5C1.5N4, the homologue of equilibrium ~-Si3N 4or hypothetical 6-C3N 4) has been investigated by high dose N § implantation i to polycrystalline 6-SIC (cubic phase). Thin films were formed using 100 keV implantations with varying ion doses and target emperatures. X-ray diffraction with a position-sensitive d tector and cross-sectional trans-mission electron microscopy revealed that the as-implanted surfaces contained ~0.1 ~m thick buried amorphous layers. Rutherford backscattering spectros-copy showed that the peak concentration f nitrogen saturated up to approxi-mately 54 at. % with increasing doses, suggesting formation of a new phase. Key words: Carbon-silicon nitride, ion-implant...
Within the present study, atomic-scale electron microscopy investigation on the crystallization beha...
Direct synthesis of uniform thickness and large-size monolayer or multilayer graphene films on insul...
The effects of 30 keV N+ implantation in amorphous silicon carbide films deposited on silicon substr...
Preliminary studies have been performed on the feasibility of carbon-silicon nitride formation ({bet...
Preliminary studies have been performed on the feasibility of carbon-silicon nitride formation Q3-Si...
A metastable C-SI-N compound has been synthesized by high dose N{sup +} implantation into polycrysta...
The alloy system Si x(Sn yC 1-y) 1-x was investigated. The purpose is to form material with reduced ...
Carbon nitride nano-compounds have been synthesized into copper by simultaneous high fluence (10 at....
The systematic study of the formation of β-SiC formed by low energy carbon ion (C-)implantation...
High temperature (420-450 degrees C) N2+-implantations at 300 keV (150 keV per atom) into high resis...
The implantation of nitrogen at an elevated temperature with a dose of (2,5-4)T016 ions/cm2 at 200 k...
The use of high dose carbon ion implantation in Si for the production of membranes and microstructur...
Silicon nitride phases are of technological interest for example as gate dielectric in thin film and...
Si1-xCx alloys of carbon (C) concentration between 0.6%-1.0% were grown in Si by ion implantation an...
Carbon nitride compounds have been synthesised in copper by simultaneous high fluence (10 at. cm) im...
Within the present study, atomic-scale electron microscopy investigation on the crystallization beha...
Direct synthesis of uniform thickness and large-size monolayer or multilayer graphene films on insul...
The effects of 30 keV N+ implantation in amorphous silicon carbide films deposited on silicon substr...
Preliminary studies have been performed on the feasibility of carbon-silicon nitride formation ({bet...
Preliminary studies have been performed on the feasibility of carbon-silicon nitride formation Q3-Si...
A metastable C-SI-N compound has been synthesized by high dose N{sup +} implantation into polycrysta...
The alloy system Si x(Sn yC 1-y) 1-x was investigated. The purpose is to form material with reduced ...
Carbon nitride nano-compounds have been synthesized into copper by simultaneous high fluence (10 at....
The systematic study of the formation of β-SiC formed by low energy carbon ion (C-)implantation...
High temperature (420-450 degrees C) N2+-implantations at 300 keV (150 keV per atom) into high resis...
The implantation of nitrogen at an elevated temperature with a dose of (2,5-4)T016 ions/cm2 at 200 k...
The use of high dose carbon ion implantation in Si for the production of membranes and microstructur...
Silicon nitride phases are of technological interest for example as gate dielectric in thin film and...
Si1-xCx alloys of carbon (C) concentration between 0.6%-1.0% were grown in Si by ion implantation an...
Carbon nitride compounds have been synthesised in copper by simultaneous high fluence (10 at. cm) im...
Within the present study, atomic-scale electron microscopy investigation on the crystallization beha...
Direct synthesis of uniform thickness and large-size monolayer or multilayer graphene films on insul...
The effects of 30 keV N+ implantation in amorphous silicon carbide films deposited on silicon substr...