Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With increasing area occupied by different on-chip memories, strategies for maintaining fault-tolerance of distributed on-chip memories become a major design challenge. We propose a system-level design methodology for scalable fault-tolerance of distributed on-chip memories in NoCs. We introduce a novel reliability clustering model for fault-tolerance analysis and shared redundancy management of on-chip memory blocks. We perform extensive design space exploration applying the proposed reliability clustering on a block-redundancy fault-tolerant scheme to evaluate the tradeoffs between reliability, performance, and overheads. Evaluations on a 64-co...
As technology scales, fault tolerance is becoming a key concern in on-chip communication. Consequent...
The increasingly parallel landscape of embedded computing platforms is bringing the reliability conc...
Advances in technology scaling, coupled with aggressive voltage scaling results in significant relia...
Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With...
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects...
Aggressive technology scaling in the nano-scale regime makes chips more susceptible to failures. Thi...
Rapid scaling of transistor gate sizes has increased the density of on-chip integration and paved th...
Network-on-Chip (NoC) is a key component in chip multiprocessors (CMPs) as it supports communication...
As the geometries of the transistors reach the physical limits of operation, one of the main design ...
Network on Chip (NoC) is a communication subsystem, which has the logic for sending and receiving th...
As silicon continues to scale, transistor reliability is becoming a major concern. At the same time,...
As the feature size scales down to deep nanometer regimes, it has enabled the designers to fabricate...
The adverse effects of technology scaling on reliability of digital circuits have made the use of fa...
Aggressive technology scaling has magnified the reliability challenges as it increases the number of...
Special Issue: 99International audienceThis paper addresses the important issue of fault tolerance i...
As technology scales, fault tolerance is becoming a key concern in on-chip communication. Consequent...
The increasingly parallel landscape of embedded computing platforms is bringing the reliability conc...
Advances in technology scaling, coupled with aggressive voltage scaling results in significant relia...
Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With...
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects...
Aggressive technology scaling in the nano-scale regime makes chips more susceptible to failures. Thi...
Rapid scaling of transistor gate sizes has increased the density of on-chip integration and paved th...
Network-on-Chip (NoC) is a key component in chip multiprocessors (CMPs) as it supports communication...
As the geometries of the transistors reach the physical limits of operation, one of the main design ...
Network on Chip (NoC) is a communication subsystem, which has the logic for sending and receiving th...
As silicon continues to scale, transistor reliability is becoming a major concern. At the same time,...
As the feature size scales down to deep nanometer regimes, it has enabled the designers to fabricate...
The adverse effects of technology scaling on reliability of digital circuits have made the use of fa...
Aggressive technology scaling has magnified the reliability challenges as it increases the number of...
Special Issue: 99International audienceThis paper addresses the important issue of fault tolerance i...
As technology scales, fault tolerance is becoming a key concern in on-chip communication. Consequent...
The increasingly parallel landscape of embedded computing platforms is bringing the reliability conc...
Advances in technology scaling, coupled with aggressive voltage scaling results in significant relia...