While the memory subsystem is already a major contribu-tor to energy consumption of computing platforms, the guard-banding required for masking the effects of ever increasing manufacturing variations in memories imposes even more energy overhead. In this paper, we explore how Partially-Forgetful Memories can be used by exploiting the intrinsic tolerance of a vast class of applications to some level of er-ror for relaxing this guard-banding in memories. We discuss the challenges to be addressed and introduce Relaxed Cache as an exemplar to address these challenges for partially-forgetful SRAM caches. Preliminary results show how adapt-ing guard-bands to application characteristics can help the system save significant amount of cache leakage ...
Recent technology trends has turned DRAMs into an interesting candidate to substitute traditional SR...
One characteristic of non-volatile memory (NVM) is that, even though it supports non-volatility, its...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Memories occupy a significant area of chip real estate and are major contributors to total system en...
Memories today expose an all-or-nothing correctness model that incurs significant costs in performan...
Leakage power in data cache memories represents a sizable fraction of total power consumption, and m...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
To continue reducing voltage in scaled technologies, both circuit and architecture-level resiliency ...
Leakage power in data cache memories represents a sizable fraction of total power consumption, and m...
Leakage power in cache memories represents a sizable fraction of total power consumption, and many t...
In this paper, we show that the vulnerability of memory components due to data retention in the pres...
Leakage power in data cache memories represents a sizable fraction of total power consumption, and m...
Memory is becoming one of the major power consumers in computing systems. Therefore, energy efficien...
The reliability of memory subsystem is fast becoming a concern in computer architecture and system d...
Technology projections indicate that static power will become a major concern in future generations ...
Recent technology trends has turned DRAMs into an interesting candidate to substitute traditional SR...
One characteristic of non-volatile memory (NVM) is that, even though it supports non-volatility, its...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
Memories occupy a significant area of chip real estate and are major contributors to total system en...
Memories today expose an all-or-nothing correctness model that incurs significant costs in performan...
Leakage power in data cache memories represents a sizable fraction of total power consumption, and m...
Abstract—With advances in process technology, soft errors are becoming an increasingly critical desi...
To continue reducing voltage in scaled technologies, both circuit and architecture-level resiliency ...
Leakage power in data cache memories represents a sizable fraction of total power consumption, and m...
Leakage power in cache memories represents a sizable fraction of total power consumption, and many t...
In this paper, we show that the vulnerability of memory components due to data retention in the pres...
Leakage power in data cache memories represents a sizable fraction of total power consumption, and m...
Memory is becoming one of the major power consumers in computing systems. Therefore, energy efficien...
The reliability of memory subsystem is fast becoming a concern in computer architecture and system d...
Technology projections indicate that static power will become a major concern in future generations ...
Recent technology trends has turned DRAMs into an interesting candidate to substitute traditional SR...
One characteristic of non-volatile memory (NVM) is that, even though it supports non-volatility, its...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...