The availability of off-the-shelf EEG headsets like

This paper examines the ability to detect a characteristic brain potential called the Error-Related Negativity (ERN) using off-the-shelf headsets and explores its applicability to HCI. ERN is triggered when a user either makes a mistake or the application behaves differently from their expectation. We first show that ERN can be seen on signals captured by EEG headsets like Emotiv ™ when doing a typical multiple choice reaction time (RT) task – Flanker task. We then present a single-trial online ERN algorithm that works by pre-computing the coefficient matrix of a logistic regression classifier using some data from a multiple choice reaction time task and uses it to classify incoming signals of that task on a single trial of data. We apply it to an interactive selection task that involved user