FULL-WAVE ANALYSIS OF MULTIPLE LOSSY MICROSTRIP LINES ON MULTILAYERED BI-ANISOTROPIC SUBSTRATES AND IMPERFECT GROUND METALLIZATION

An extended spectral-domain immittance approach is used to analyze multiconductor systems on layered bi-anisotro-pic substrates. Apart from the losses of the bi-anisotropic lay-ers, the method takes into account the metallization thickness and losses of both the ground metallization and the multi-con-ductor system which can consist of conventional or high-Tc superconductors, It is demonstrated that due to the order, per-mittivity and anisotropy of substrate layers, the propagation characteristics of a multi-conductor system can be influenced to obtain a frequency range of almost identical complex propaga-tion constants for all fundamental modes involved. Such a behavior can be advantageously utilized in future applications of high-speed interconnects and high-directivity couplers. Since the algorithm is CPU-time efficient and operational on modern workstations, the developed model offers an attractive solution for modern MMIC design purposes. At the example of a cou-pled pair of micmstrip lines on anisotropic substrate, results are compared with previously published data and are found to be in excellent agreement. I