chip (NoC) fabrics are increasingly becoming susceptible to transient faults. Fault-tolerance mechanisms that are typically employed in NoCs usually entail significant energy overheads that are expected to become prohibitive as fault rates increase in future CMOS technologies. We propose a system-level framework called HEFT to trade-off energy consumption and fault-tolerance in the NoC fabric. Our hybrid framework tackles the challenge of enabling energy-efficient resilience in NoCs in two phases: at design time and at runtime. At design time, we implement an algorithm to guide the robust mapping of cores on to a die while satisfying application bandwidth and latency constraints. At runtime we devise a prediction algorithm to monitor and de...
Scaling CMOS technology into nanometer feature-size nodes has made it practically impossible to prec...
The aggressive semiconductor technology scaling provides the means for doubling the amount of transi...
Nowadays highly dependable electronic devices are demanded by many safety-critical applications. Dep...
With feature sizes far below the wavelength of light, variations in fabrication processes are becomi...
Aggressive scaling of CMOS process technology allows the fabrication of highly integrated chips such...
Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With...
Parallel computing challenges in embedded system design results in development of architectures havi...
As feature sizes continue to shrink with the advancement of nanotechnology, multiprocessor system-on...
As silicon continues to scale, transistor reliability is becoming a major concern. At the same time,...
Nowadays, dependable computing systems are widely required in mission-critical applications. While t...
The increasingly parallel landscape of embedded computing platforms is bringing the reliability conc...
The end of Dennard scaling has promoted low power consumption into a first-order concern for computi...
Network on Chip (NoC) is a communication subsystem, which has the logic for sending and receiving th...
As the complexity of applications grows with each new generation, so does the demand for computation...
Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With...
Scaling CMOS technology into nanometer feature-size nodes has made it practically impossible to prec...
The aggressive semiconductor technology scaling provides the means for doubling the amount of transi...
Nowadays highly dependable electronic devices are demanded by many safety-critical applications. Dep...
With feature sizes far below the wavelength of light, variations in fabrication processes are becomi...
Aggressive scaling of CMOS process technology allows the fabrication of highly integrated chips such...
Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With...
Parallel computing challenges in embedded system design results in development of architectures havi...
As feature sizes continue to shrink with the advancement of nanotechnology, multiprocessor system-on...
As silicon continues to scale, transistor reliability is becoming a major concern. At the same time,...
Nowadays, dependable computing systems are widely required in mission-critical applications. While t...
The increasingly parallel landscape of embedded computing platforms is bringing the reliability conc...
The end of Dennard scaling has promoted low power consumption into a first-order concern for computi...
Network on Chip (NoC) is a communication subsystem, which has the logic for sending and receiving th...
As the complexity of applications grows with each new generation, so does the demand for computation...
Network-on-Chips (NoCs) more susceptible to failures that cause various reliability challenges. With...
Scaling CMOS technology into nanometer feature-size nodes has made it practically impossible to prec...
The aggressive semiconductor technology scaling provides the means for doubling the amount of transi...
Nowadays highly dependable electronic devices are demanded by many safety-critical applications. Dep...