In this paper we introduce Resizable Data Composer-Cache (RDC-Cache). This novel cache architecture operates correctly at sub 500 mV in 65 nm technology tolerating large number of Manufacturing Process Variation induced defects. Based on a smart relocation methodology, RDC-Cache decomposes the data that is targeted for a defective cache way and relocates one or few word to a new location avoiding a write to defective bits. Upon a read request, the requested data is recomposed through an inverse operation. For the purpose of fault tolerance at low voltages the cache size is reduced, however, in this architecture the final cache size is considerably higher compared to previously suggested resizable cache organizations [2][3]. The following th...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2016.Energy ...
Aggressive technology scaling in the nano-scale regime makes chips more susceptible to failures. Thi...
To continue reducing voltage in scaled technologies, both circuit and architecture-level resiliency ...
Caches are known to consume a large part of total microprocessor power. Traditionally, voltage scali...
Abstract—This paper proposes a new fault tolerant cache organ-ization capable of dynamically mapping...
Caches are known to consume a large part of total microprocessor power. Traditionally, voltage scali...
Transistors per area unit double in every new technology node. However, the electric field density a...
Process parameter variations are expected to be significantly high in a sub-50-nm technology regime,...
This paper proposes a novel adaptable and reliable L1 data cache design (Adapcache) with the unique ...
One of the most effective techniques to reduce a processor\u27s power consumption is to reduce suppl...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
Voltage scaling to values near the threshold voltage is a promising technique to hold off the many-c...
© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Complex approaches to fault-tolerant voltage-scalable (FTVS) SRAM cache architectures can suffer fro...
Abstract—In this paper we present the “Variation Trained Drowsy Cache ” (VTD-Cache) architecture. VT...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2016.Energy ...
Aggressive technology scaling in the nano-scale regime makes chips more susceptible to failures. Thi...
To continue reducing voltage in scaled technologies, both circuit and architecture-level resiliency ...
Caches are known to consume a large part of total microprocessor power. Traditionally, voltage scali...
Abstract—This paper proposes a new fault tolerant cache organ-ization capable of dynamically mapping...
Caches are known to consume a large part of total microprocessor power. Traditionally, voltage scali...
Transistors per area unit double in every new technology node. However, the electric field density a...
Process parameter variations are expected to be significantly high in a sub-50-nm technology regime,...
This paper proposes a novel adaptable and reliable L1 data cache design (Adapcache) with the unique ...
One of the most effective techniques to reduce a processor\u27s power consumption is to reduce suppl...
Improving energy efficiency is critical to increasing computing capability, from mobile devices oper...
Voltage scaling to values near the threshold voltage is a promising technique to hold off the many-c...
© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Complex approaches to fault-tolerant voltage-scalable (FTVS) SRAM cache architectures can suffer fro...
Abstract—In this paper we present the “Variation Trained Drowsy Cache ” (VTD-Cache) architecture. VT...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2016.Energy ...
Aggressive technology scaling in the nano-scale regime makes chips more susceptible to failures. Thi...
To continue reducing voltage in scaled technologies, both circuit and architecture-level resiliency ...