Abstract—Instance and temperature-dependent power variation has a direct impact on quality of sensing for battery powered, long running sensing applications. We measure and characterize active and leakage power for an ARM Cortex M3 processor, and show that across a temperature range of 20–60◦C there is 10 % variation in active power, and 14x variation in leakage power. We introduce variability aware duty cycling methods and a duty cycle abstraction for TinyOS that allows ap-plications to explicitly specify lifetime and minimum duty cycle requirements for individual tasks, and dynamically adjusts duty cycle rates so that overall quality of service is maximized in the presence of power variability. We show that variability-aware duty cycling ...
International audiencePower efficiency of embedded systems is a tremendous challenge within the cont...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
Many threats that can undermine the reliability of a system can be realized at design, while others ...
With scaling of semiconductor fabrication technologies and the push towards deep sub-micron technolo...
Increasing hardware variability in newer integrated circuit fabrication technologies has caused corr...
Variability is a key issue in modern multiprocessors, resulting in performance and lifetime uncertai...
As semiconductor manufacturers build smaller components, circuits and chips at that scale become les...
With extensive use of battery powered devices such as smartphones, laptops and tablets energy effici...
Today, there are more mobile devices than human beings on the planet. Mobiles execute a wide variety...
With the explosion of sensing platforms and modalities in recent decades and the growing interest in...
Within-die variation in leakage power consumption is sub-stantial and increasing for chip-level mult...
Process and environmental temperature variations have a detrimental effect on performance and reliab...
Abstract—Variation-aware design involves designing circuits tolerant to process and temperature vari...
Increasing variability in nano-CMOS technologies poses a major challenge for low power design. Conve...
Embedded system market growth is fast in the last couple of decades, especially with the current dem...
International audiencePower efficiency of embedded systems is a tremendous challenge within the cont...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
Many threats that can undermine the reliability of a system can be realized at design, while others ...
With scaling of semiconductor fabrication technologies and the push towards deep sub-micron technolo...
Increasing hardware variability in newer integrated circuit fabrication technologies has caused corr...
Variability is a key issue in modern multiprocessors, resulting in performance and lifetime uncertai...
As semiconductor manufacturers build smaller components, circuits and chips at that scale become les...
With extensive use of battery powered devices such as smartphones, laptops and tablets energy effici...
Today, there are more mobile devices than human beings on the planet. Mobiles execute a wide variety...
With the explosion of sensing platforms and modalities in recent decades and the growing interest in...
Within-die variation in leakage power consumption is sub-stantial and increasing for chip-level mult...
Process and environmental temperature variations have a detrimental effect on performance and reliab...
Abstract—Variation-aware design involves designing circuits tolerant to process and temperature vari...
Increasing variability in nano-CMOS technologies poses a major challenge for low power design. Conve...
Embedded system market growth is fast in the last couple of decades, especially with the current dem...
International audiencePower efficiency of embedded systems is a tremendous challenge within the cont...
Shrinking of device dimensions has undoubtedly enabled the very large scale integration of transisto...
Many threats that can undermine the reliability of a system can be realized at design, while others ...