A CXXXX American Chemical Society Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy

uperior electrical and thermal properties of single-walled carbon nanotubes (SWNTs) enable high-performance tran-sistors,1,2 advanced interconnects,3 and other components of relevance to various existing and emerging forms of electronics. Heat gen-eration and transport characteristics of de-vices that incorporate SWNTs are critical in understanding the fundamental properties and engineering considerations in device de-sign. Such issues are particularly important because all known growth techniques yield SWNTs with distributions in diameters and chiralities and with densities of defects that can affect device performance4,5 either di