Add to ORKGSpectroscopic ellipsometry studies of thin film a-Si:H solar cell fabrication by multichamber deposition in the n-i-p substrate configuratio
Thin film multilayer structures have been characterised fully using time-resolved and static studies...
Electron Microscopy and Analysis Group Conference 2017, EMAG 2017 -- 3 July 2017 through 6 July 2017...
Crystallinity and material quality of hydrogenated microcrystalline silicon (μc-Si:H) films change d...
To seek for reliable and cheap technology and material to produce a solar cell, intensive researches...
Highly developed and sophisticated production techniques of modern solar cells with functional optic...
Light emission from silicon-based materials is a very important research area for optoelectronic and...
Optimization of thin film photovoltaics (PV) relies on characterizing the optoelectronic and structu...
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizatio...
Stacks of dielectric thin films are widely used for passivated emitter and rear solar cells based on...
We have utilized ex-situ spectroscopic ellipsometry and HRTEM to characterize the optical and struct...
Organic solar cells attract both scientific and economic interest due to their potential for clean a...
Real time spectroscopic ellipsometry has been applied to develop deposition phase diagrams for p-typ...
International audienceThis Spotlight describes the methods used for the optical characterization and...
In this paper we report on the effect of monitoring the i-layer region near the p-i interface with t...
Optical parameters of a-Si:H and indium tin oxide (ITO) thin lms deposited on glass sub-strates are ...
Thin film multilayer structures have been characterised fully using time-resolved and static studies...
Electron Microscopy and Analysis Group Conference 2017, EMAG 2017 -- 3 July 2017 through 6 July 2017...
Crystallinity and material quality of hydrogenated microcrystalline silicon (μc-Si:H) films change d...
To seek for reliable and cheap technology and material to produce a solar cell, intensive researches...
Highly developed and sophisticated production techniques of modern solar cells with functional optic...
Light emission from silicon-based materials is a very important research area for optoelectronic and...
Optimization of thin film photovoltaics (PV) relies on characterizing the optoelectronic and structu...
Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizatio...
Stacks of dielectric thin films are widely used for passivated emitter and rear solar cells based on...
We have utilized ex-situ spectroscopic ellipsometry and HRTEM to characterize the optical and struct...
Organic solar cells attract both scientific and economic interest due to their potential for clean a...
Real time spectroscopic ellipsometry has been applied to develop deposition phase diagrams for p-typ...
International audienceThis Spotlight describes the methods used for the optical characterization and...
In this paper we report on the effect of monitoring the i-layer region near the p-i interface with t...
Optical parameters of a-Si:H and indium tin oxide (ITO) thin lms deposited on glass sub-strates are ...
Thin film multilayer structures have been characterised fully using time-resolved and static studies...
Electron Microscopy and Analysis Group Conference 2017, EMAG 2017 -- 3 July 2017 through 6 July 2017...
Crystallinity and material quality of hydrogenated microcrystalline silicon (μc-Si:H) films change d...