A Survey on Dram Testing and Its Algorithms

Since the minimum feature size of dynamic RAM has been scaled down, several studies have been carried out to sense the faulty cells. In the field of testing, more appropriate test algorithms are required to detect the faults in the cells. In this paper, various test algorithms such as March tests, word line pulsing technique, large Vds Data Retention Test Pattern, interleaving test algorithm are discussed. These algorithms allow the screening of faults in the cells