TEXTURE EVALUATION OF NIO BUFFER LAYER FORMED BY SURFACE OXIDATION EPITAXY OF (100) <001> NI-CR

Texture evolution of NiO formed during oxidation of polycrystalline single oriented (100)<001> Ni-Cr was investigated. This foil was also termed rolling assisted biaxially textured substrate (RABiTS). X-ray diffractograms of oxidized Ni-Cr RABiTS foil showed the existence of mostly (200) NiO indicating (100)-type NiO formed exclusively on (100) singly oriented Ni-Cr grains. Epitaxial relationship between the two layers is observed. However the dual-in-plane texture was recorded. The in-plane texture was assessed by conducting phi scan and plotting series of pole figures measured at (111) NiO peak. The mechanism of the oxides formation was proposed to take into account the formation of (100)-type NiO. Cross section morphology of the oxidised foils reveals two oxidation layers; fast growing external layer consisting of the (100)-type NiO and an internal layer consisted of mostly Cr2O3 and maybe NiCr2O4. The thickness of NiO was ~ 10Pm. Cr2O3 formed as needle-like oxides embedded in a matrix of Ni foil. Inward diffusion of oxygen is believed to have caused this to happen. The external NiO layer was consisted of duplex microstructure characterised by columnar layer growing vertical on the surface of the metal and a few micron thick of equiaxed NiO. Delamination of the outer NiO layer often occurred at the columnar-equiaxed interface which could be cured by CeO2 deposition on the foil prior to the oxidation process. CeO2 was deposited by conversion immersion using Ce(NO3)3.6H2O solution. (200) NiO formed on this coated sample as well