Abstract In an on-chip network, roughly 80 % of the communication faults are transient [9]. Different fault tolerance approaches such as Forward Error Control (FEC), Automatic Repeat Query (ARQ), and multi-path routing have been used and compared in literature for reliable on-chip transmission [15-17]. These approaches tolerate transient faults, but they become ineffective in the presence of permanent faults. Permanent faults on wires occur both during manufacturing and in the field, causing yield degradation and service costs respectively. The overall system cost can be reduced by adding some spare wires per each link of the network to replace the defective wires [15,18]. Nevertheless, an in-field diagnosis mechanism is required to locate ...
International audienceDue to transistor shrinking and core number increasing in System-on-Chip (SoC)...
International audienceNoCs (Networks-on-Chips) are being viewed as the paradigm of choice for on-chi...
In this article, we discuss design constraints to characterize efficient error recovery mechanisms f...
International audienceThe use of fault-tolerant mechanism is essential to ensure the correct functio...
Aggressive technology scaling has magnified the reliability challenges as it increases the number of...
Abstract—The structural redundancy inherent to on-chip interconnection networks [networks on chip (N...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2011.Reliabi...
Downscaled complementary metal-oxide semiconductor (CMOS) technology feature sizes have enabled mass...
As technology scales into nanoscale regime, it is impossible to guarantee the perfect hardware desig...
Rapid scaling of transistor gate sizes has increased the density of on-chip integration and paved th...
Silicon technology scaling is continuously enabling denser integration capabilities. However, this c...
Chip-to-chip (CTC) connections often involve serializing parallel data. This serialized data is tran...
Abstract. In DSM and nanometer technology, there will present more and more new fault types, which a...
On-chip interconnection networks for future systems on chip (SoC) will have to deal with the increas...
The aggressive semiconductor technology scaling provides the means for doubling the amount of transi...
International audienceDue to transistor shrinking and core number increasing in System-on-Chip (SoC)...
International audienceNoCs (Networks-on-Chips) are being viewed as the paradigm of choice for on-chi...
In this article, we discuss design constraints to characterize efficient error recovery mechanisms f...
International audienceThe use of fault-tolerant mechanism is essential to ensure the correct functio...
Aggressive technology scaling has magnified the reliability challenges as it increases the number of...
Abstract—The structural redundancy inherent to on-chip interconnection networks [networks on chip (N...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical and Computer Engineering, 2011.Reliabi...
Downscaled complementary metal-oxide semiconductor (CMOS) technology feature sizes have enabled mass...
As technology scales into nanoscale regime, it is impossible to guarantee the perfect hardware desig...
Rapid scaling of transistor gate sizes has increased the density of on-chip integration and paved th...
Silicon technology scaling is continuously enabling denser integration capabilities. However, this c...
Chip-to-chip (CTC) connections often involve serializing parallel data. This serialized data is tran...
Abstract. In DSM and nanometer technology, there will present more and more new fault types, which a...
On-chip interconnection networks for future systems on chip (SoC) will have to deal with the increas...
The aggressive semiconductor technology scaling provides the means for doubling the amount of transi...
International audienceDue to transistor shrinking and core number increasing in System-on-Chip (SoC)...
International audienceNoCs (Networks-on-Chips) are being viewed as the paradigm of choice for on-chi...
In this article, we discuss design constraints to characterize efficient error recovery mechanisms f...