I. UNDERSTANDING AGING

Abstract—As transistor downsizing continues beyond Moore’s law, new challenges plague its operation, affecting its reliability with time and hence characterizing the aging behavior of the entire microarchitecture. With increased variability and unreliability owing to the breakdown of traditional bulk approximations, new constraints call for reconsideration and inclusion of a larger number of design goals. The major aging factors and some novel and insightful approaches to tackle and better characterize the same have been discussed in this paper. Key techniques used and tradeoffs in and between these different approaches with projections for future work have been presented to indicate their position in research