For decades, high performance processors have provided architectural and microar-chitectural abstractions that enable applications to exploit parallelism as a means to fruitfully utilize the exponentially increasing on-chip transistor counts. With shrinking device sizes, reduced supply voltages and growing integration densities leading to logic elements becoming increasingly susceptible to transient faults, re-search works have established techniques to leverage existing on-chip parallelism-targeted abstractions to provide redundancy for processor pipelines, thereby increasing their resilience to transient faults. While prior works have viewed the impact of provisioning such redundancy as performance and/or implementation costs, this thesis...
Power and reliability issues are expected to increase in future multicore systems with a higher degr...
Timing speculation has been proposed as a technique for maximizing energy efficiency of processors w...
Journal ArticleNoise and radiation-induced soft errors (transient faults) in computer systems have i...
Part 2: Asian Conference on Availability, Reliability and Security (AsiaARES)International audienceF...
Recent trends in transistor technology have dictated the constant reduction of device size. One nega...
Premi extraordinari doctorat 2013-2014During the last decades, human beings have experienced a signi...
Exploitation of parallelism has for decades been central to the pursuit of computing performance. Th...
Reliability has become a serious concern as systems em-brace nanometer technologies. In this paper, ...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
Semiconductor technology scaling has long been a source of dramatic gains in our computing capabilit...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
Nowadays, System-on-Chip architectures are composed of several execution resources which support com...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
Nowadays, dependable computing systems are widely required in mission-critical applications. While t...
Power and reliability issues are expected to increase in future multicore systems with a higher degr...
Timing speculation has been proposed as a technique for maximizing energy efficiency of processors w...
Journal ArticleNoise and radiation-induced soft errors (transient faults) in computer systems have i...
Part 2: Asian Conference on Availability, Reliability and Security (AsiaARES)International audienceF...
Recent trends in transistor technology have dictated the constant reduction of device size. One nega...
Premi extraordinari doctorat 2013-2014During the last decades, human beings have experienced a signi...
Exploitation of parallelism has for decades been central to the pursuit of computing performance. Th...
Reliability has become a serious concern as systems em-brace nanometer technologies. In this paper, ...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
Semiconductor technology scaling has long been a source of dramatic gains in our computing capabilit...
As device density grows, each transistor gets smaller and more fragile leading to an overall higher ...
Nowadays, System-on-Chip architectures are composed of several execution resources which support com...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
Nowadays, dependable computing systems are widely required in mission-critical applications. While t...
Power and reliability issues are expected to increase in future multicore systems with a higher degr...
Timing speculation has been proposed as a technique for maximizing energy efficiency of processors w...
Journal ArticleNoise and radiation-induced soft errors (transient faults) in computer systems have i...